Method for characterization of a spherically bent crystal for K.alpha. X-ray imaging of laser plasmas using a focusing monochromator geometry
Abstract
A method is provided for characterizing spectrometric properties (e.g., peak reflectivity, reflection curve width, and Bragg angle offset) of the K.alpha. emission line reflected narrowly off angle of the direct reflection of a bent crystal and in particular of a spherically bent quartz 200 crystal by analyzing the off-angle x-ray emission from a stronger emission line reflected at angles far from normal incidence. The bent quartz crystal can therefore accurately image argon K.alpha. x-rays at near-normal incidence (Bragg angle of approximately 81 degrees). The method is useful for in-situ calibration of instruments employing the crystal as a grating by first operating the crystal as a high throughput focusing monochromator on the Rowland circle at angles far from normal incidence (Bragg angle approximately 68 degrees) to make a reflection curve with the He-like x-rays such as the He-.alpha. emission line observed from a laser-excited plasma.
- Inventors:
- Issue Date:
- Research Org.:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1177502
- Patent Number(s):
- 9001968
- Application Number:
- 13/662,038
- Assignee:
- Lawrence Livermore National Security, LLC (Livermore, CA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G - PHYSICS G21 - NUCLEAR PHYSICS G21B - FUSION REACTORS
- DOE Contract Number:
- AC52-07NA27344
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2012 Oct 26
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; 74 ATOMIC AND MOLECULAR PHYSICS
Citation Formats
Kugland, Nathan, Doeppner, Tilo, Glenzer, Siegfried, Constantin, Carmen, Niemann, Chris, and Neumayer, Paul. Method for characterization of a spherically bent crystal for K.alpha. X-ray imaging of laser plasmas using a focusing monochromator geometry. United States: N. p., 2015.
Web.
Kugland, Nathan, Doeppner, Tilo, Glenzer, Siegfried, Constantin, Carmen, Niemann, Chris, & Neumayer, Paul. Method for characterization of a spherically bent crystal for K.alpha. X-ray imaging of laser plasmas using a focusing monochromator geometry. United States.
Kugland, Nathan, Doeppner, Tilo, Glenzer, Siegfried, Constantin, Carmen, Niemann, Chris, and Neumayer, Paul. Tue .
"Method for characterization of a spherically bent crystal for K.alpha. X-ray imaging of laser plasmas using a focusing monochromator geometry". United States. https://www.osti.gov/servlets/purl/1177502.
@article{osti_1177502,
title = {Method for characterization of a spherically bent crystal for K.alpha. X-ray imaging of laser plasmas using a focusing monochromator geometry},
author = {Kugland, Nathan and Doeppner, Tilo and Glenzer, Siegfried and Constantin, Carmen and Niemann, Chris and Neumayer, Paul},
abstractNote = {A method is provided for characterizing spectrometric properties (e.g., peak reflectivity, reflection curve width, and Bragg angle offset) of the K.alpha. emission line reflected narrowly off angle of the direct reflection of a bent crystal and in particular of a spherically bent quartz 200 crystal by analyzing the off-angle x-ray emission from a stronger emission line reflected at angles far from normal incidence. The bent quartz crystal can therefore accurately image argon K.alpha. x-rays at near-normal incidence (Bragg angle of approximately 81 degrees). The method is useful for in-situ calibration of instruments employing the crystal as a grating by first operating the crystal as a high throughput focusing monochromator on the Rowland circle at angles far from normal incidence (Bragg angle approximately 68 degrees) to make a reflection curve with the He-like x-rays such as the He-.alpha. emission line observed from a laser-excited plasma.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Apr 07 00:00:00 EDT 2015},
month = {Tue Apr 07 00:00:00 EDT 2015}
}
Works referenced in this record:
Method and apparatus for producing monochromatic radiography with a bent laue crystal
patent, March 2000
- Zhong, Zhong; Chapman, Leonard; Thomlinson, William C.
- US Patent Document 6,038,285
X-ray imaging crystal spectrometer for extended X-ray sources
patent, July 2001
- Bitter, Manfred; Fraenkel, Ben; Gorman, James L.
- US Patent Document 6,259,763