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Title: Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure with image analysis

Abstract

A system and method utilizes an image analysis approach for controlling the collection instrument-to-surface distance in a sampling system for use, for example, with mass spectrometric detection. Such an approach involves the capturing of an image of the collection instrument or the shadow thereof cast across the surface and the utilization of line average brightness (LAB) techniques to determine the actual distance between the collection instrument and the surface. The actual distance is subsequently compared to a target distance for re-optimization, as necessary, of the collection instrument-to-surface during an automated surface sampling operation.

Inventors:
;
Issue Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1176432
Patent Number(s):
7995216
Application Number:
12/217,224
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Van Berkel, Gary J., and Kertesz, Vilmos. Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure with image analysis. United States: N. p., 2011. Web.
Van Berkel, Gary J., & Kertesz, Vilmos. Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure with image analysis. United States.
Van Berkel, Gary J., and Kertesz, Vilmos. Tue . "Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure with image analysis". United States. https://www.osti.gov/servlets/purl/1176432.
@article{osti_1176432,
title = {Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure with image analysis},
author = {Van Berkel, Gary J. and Kertesz, Vilmos},
abstractNote = {A system and method utilizes an image analysis approach for controlling the collection instrument-to-surface distance in a sampling system for use, for example, with mass spectrometric detection. Such an approach involves the capturing of an image of the collection instrument or the shadow thereof cast across the surface and the utilization of line average brightness (LAB) techniques to determine the actual distance between the collection instrument and the surface. The actual distance is subsequently compared to a target distance for re-optimization, as necessary, of the collection instrument-to-surface during an automated surface sampling operation.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2011},
month = {8}
}

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