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Title: Radiation-resistant microorganism

Abstract

An isolated and purified bacterium is provided which was isolated from a high-level radioactive waste site of mixed waste. The isolate has the ability to degrade a wide variety of organic contaminants while demonstrating high tolerance to ionizing radiation. The organism is uniquely suited to bioremediation of a variety or organic contaminants while in the presence of ionizing radiation.

Inventors:
Issue Date:
Research Org.:
Savannah River National Lab (SRNL), Aiken, SC (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1176360
Patent Number(s):
7,736,887
Application Number:
11/642,220
Assignee:
Savannah River Nuclear Solutions, LLC (Aiken, SC)
DOE Contract Number:  
AC09-96SR18500
Resource Type:
Patent
Resource Relation:
Patent File Date: 2006 Dec 20
Country of Publication:
United States
Language:
English
Subject:
59 BASIC BIOLOGICAL SCIENCES

Citation Formats

Fliermans, Carl B. Radiation-resistant microorganism. United States: N. p., 2010. Web.
Fliermans, Carl B. Radiation-resistant microorganism. United States.
Fliermans, Carl B. Tue . "Radiation-resistant microorganism". United States. https://www.osti.gov/servlets/purl/1176360.
@article{osti_1176360,
title = {Radiation-resistant microorganism},
author = {Fliermans, Carl B.},
abstractNote = {An isolated and purified bacterium is provided which was isolated from a high-level radioactive waste site of mixed waste. The isolate has the ability to degrade a wide variety of organic contaminants while demonstrating high tolerance to ionizing radiation. The organism is uniquely suited to bioremediation of a variety or organic contaminants while in the presence of ionizing radiation.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2010},
month = {6}
}

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Works referenced in this record:

Kineococcus radiotolerans sp. nov., a radiation-resistant, Gram-positive bacterium
journal, May 2002

  • Phillips, R. W.
  • INTERNATIONAL JOURNAL OF SYSTEMATIC AND EVOLUTIONARY MICROBIOLOGY, Vol. 52, Issue 3
  • DOI: 10.1099/ijs.0.02029-0