Selective etching of silicon carbide films
Abstract
A method of etching silicon carbide using a nonmetallic mask layer. The method includes providing a silicon carbide substrate; forming a non-metallic mask layer by applying a layer of material on the substrate; patterning the mask layer to expose underlying areas of the substrate; and etching the underlying areas of the substrate with a plasma at a first rate, while etching the mask layer at a rate lower than the first rate.
- Inventors:
- Issue Date:
- Research Org.:
- Sandia National Lab. (SNL-CA), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1176038
- Patent Number(s):
- 7151277
- Application Number:
- 10/613,508
- Assignee:
- The Regents of the University of California (Oakland, CA)
- Patent Classifications (CPCs):
-
B - PERFORMING OPERATIONS B81 - MICROSTRUCTURAL TECHNOLOGY B81C - PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
- DOE Contract Number:
- 9782
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2003 Jul 03
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Gao, Di, Howe, Roger T., and Maboudian, Roya. Selective etching of silicon carbide films. United States: N. p., 2006.
Web.
Gao, Di, Howe, Roger T., & Maboudian, Roya. Selective etching of silicon carbide films. United States.
Gao, Di, Howe, Roger T., and Maboudian, Roya. Tue .
"Selective etching of silicon carbide films". United States. https://www.osti.gov/servlets/purl/1176038.
@article{osti_1176038,
title = {Selective etching of silicon carbide films},
author = {Gao, Di and Howe, Roger T. and Maboudian, Roya},
abstractNote = {A method of etching silicon carbide using a nonmetallic mask layer. The method includes providing a silicon carbide substrate; forming a non-metallic mask layer by applying a layer of material on the substrate; patterning the mask layer to expose underlying areas of the substrate; and etching the underlying areas of the substrate with a plasma at a first rate, while etching the mask layer at a rate lower than the first rate.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2006},
month = {12}
}
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