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Title: Vertically aligned nanostructure scanning probe microscope tips

Abstract

Methods and apparatus are described for cantilever structures that include a vertically aligned nanostructure, especially vertically aligned carbon nanofiber scanning probe microscope tips. An apparatus includes a cantilever structure including a substrate including a cantilever body, that optionally includes a doped layer, and a vertically aligned nanostructure coupled to the cantilever body.

Inventors:
; ; ; ; ;
Issue Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1176036
Patent Number(s):
7151256
Application Number:
10/716,770
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
Patent Classifications (CPCs):
B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY

Citation Formats

Guillorn, Michael A., Ilic, Bojan, Melechko, Anatoli V., Merkulov, Vladimir I., Lowndes, Douglas H., and Simpson, Michael L. Vertically aligned nanostructure scanning probe microscope tips. United States: N. p., 2006. Web.
Guillorn, Michael A., Ilic, Bojan, Melechko, Anatoli V., Merkulov, Vladimir I., Lowndes, Douglas H., & Simpson, Michael L. Vertically aligned nanostructure scanning probe microscope tips. United States.
Guillorn, Michael A., Ilic, Bojan, Melechko, Anatoli V., Merkulov, Vladimir I., Lowndes, Douglas H., and Simpson, Michael L. Tue . "Vertically aligned nanostructure scanning probe microscope tips". United States. https://www.osti.gov/servlets/purl/1176036.
@article{osti_1176036,
title = {Vertically aligned nanostructure scanning probe microscope tips},
author = {Guillorn, Michael A. and Ilic, Bojan and Melechko, Anatoli V. and Merkulov, Vladimir I. and Lowndes, Douglas H. and Simpson, Michael L.},
abstractNote = {Methods and apparatus are described for cantilever structures that include a vertically aligned nanostructure, especially vertically aligned carbon nanofiber scanning probe microscope tips. An apparatus includes a cantilever structure including a substrate including a cantilever body, that optionally includes a doped layer, and a vertically aligned nanostructure coupled to the cantilever body.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Dec 19 00:00:00 EST 2006},
month = {Tue Dec 19 00:00:00 EST 2006}
}

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