Spatial-heterodyne interferometry for transmission (SHIFT) measurements

Bingham, Philip R.; Hanson, Gregory R.; Tobin, Ken W.

Advanced Search OptionsAdvanced Search queries use a traditional Term Search. For more info, see our FAQ.

All Fields:

Patent Title:

Abstract:

Assignee:

Inventor(s):

Patent Number:

Patent Classification (CPC):

All Classifications
A - human necessities
A01 - agriculture
A21 - baking
A22 - butchering
A23 - foods or foodstuffs
A24 - tobacco
A41 - wearing apparel
A42 - headwear
A43 - footwear
A44 - haberdashery
A45 - hand or travelling articles
A46 - brushware
A47 - furniture
A61 - medical or veterinary science
A62 - life-saving
A63 - sports
A99 - subject matter not otherwise provided for in this section
B - performing operations
B01 - physical or chemical processes or apparatus in general
B02 - crushing, pulverising, or disintegrating
B03 - separation of solid materials using liquids or using pneumatic tables or jigs
B04 - centrifugal apparatus or machines for carrying-out physical or chemical processes
B05 - spraying or atomising in general
B06 - generating or transmitting mechanical vibrations in general
B07 - separating solids from solids
B08 - cleaning
B09 - disposal of solid waste
B21 - mechanical metal-working without essentially removing material
B22 - casting
B23 - machine tools
B24 - grinding
B25 - hand tools
B26 - hand cutting tools
B27 - working or preserving wood or similar material
B28 - working cement, clay, or stone
B29 - working of plastics
B30 - presses
B31 - making articles of paper, cardboard or material worked in a manner analogous to paper
B32 - layered products
B33 - additive manufacturing technology
B41 - printing
B42 - bookbinding
B43 - writing or drawing implements
B44 - decorative arts
B60 - vehicles in general
B61 - railways
B62 - land vehicles for travelling otherwise than on rails
B63 - ships or other waterborne vessels
B64 - aircraft
B65 - conveying
B66 - hoisting
B67 - opening, closing {or cleaning} bottles, jars or similar containers
B68 - saddlery
B81 - microstructural technology
B82 - nanotechnology
B99 - subject matter not otherwise provided for in this section
C - chemistry
C01 - inorganic chemistry
C02 - treatment of water, waste water, sewage, or sludge
C03 - glass
C04 - cements
C05 - fertilisers
C06 - explosives
C07 - organic chemistry
C08 - organic macromolecular compounds
C09 - dyes
C10 - petroleum, gas or coke industries
C11 - animal or vegetable oils, fats, fatty substances or waxes
C12 - biochemistry
C13 - sugar industry
C14 - skins
C21 - metallurgy of iron
C22 - metallurgy
C23 - coating metallic material
C25 - electrolytic or electrophoretic processes
C30 - crystal growth
C40 - combinatorial technology
C99 - subject matter not otherwise provided for in this section
D - textiles
D01 - natural or man-made threads or fibres
D02 - yarns
D03 - weaving
D04 - braiding
D05 - sewing
D06 - treatment of textiles or the like
D07 - ropes
D10 - indexing scheme associated with sublasses of section d, relating to textiles
D21 - paper-making
D99 - subject matter not otherwise provided for in this section
E - fixed constructions
E01 - construction of roads, railways, or bridges
E02 - hydraulic engineering
E03 - water supply
E04 - building
E05 - locks
E06 - doors, windows, shutters, or roller blinds in general
E21 - earth drilling
E99 - subject matter not otherwise provided for in this section
F - mechanical engineering
F01 - machines or engines in general
F02 - combustion engines
F03 - machines or engines for liquids
F04 - positive - displacement machines for liquids
F05 - indexing schemes relating to engines or pumps in various subclasses of classes f01-f04
F15 - fluid-pressure actuators
F16 - engineering elements and units
F17 - storing or distributing gases or liquids
F21 - lighting
F22 - steam generation
F23 - combustion apparatus
F24 - heating
F25 - refrigeration or cooling
F26 - drying
F27 - furnaces
F28 - heat exchange in general
F41 - weapons
F42 - ammunition
F99 - subject matter not otherwise provided for in this section
G - physics
G01 - measuring
G02 - optics
G03 - photography
G04 - horology
G05 - controlling
G06 - computing
G07 - checking-devices
G08 - signalling
G09 - education
G10 - musical instruments
G11 - information storage
G12 - instrument details
G16 - information and communication technology [ict] specially adapted for specific application fields
G21 - nuclear physics
G99 - subject matter not otherwise provided for in this section
H - electricity
H01 - basic electric elements
H02 - generation
H03 - basic electronic circuitry
H04 - electric communication technique
H05 - electric techniques not otherwise provided for
H99 - subject matter not otherwise provided for in this section
Y - new / cross sectional technologies
Y02 - technologies or applications for mitigation or adaptation against climate change
Y04 - information or communication technologies having an impact on other technology areas
Y10 - technical subjects covered by former uspc

More Options ...

Title: Spatial-heterodyne interferometry for transmission (SHIFT) measurements

Abstract

Systems and methods are described for spatial-heterodyne interferometry for transmission (SHIFT) measurements. A method includes digitally recording a spatially-heterodyned hologram including spatial heterodyne fringes for Fourier analysis using a reference beam, and an object beam that is transmitted through an object that is at least partially translucent; Fourier analyzing the digitally recorded spatially-heterodyned hologram, by shifting an original origin of the digitally recorded spatially-heterodyned hologram to sit on top of a spatial-heterodyne carrier frequency defined by an angle between the reference beam and the object beam, to define an analyzed image; digitally filtering the analyzed image to cut off signals around the original origin to define a result; and performing an inverse Fourier transform on the result.

Inventors:: Bingham, Philip R.; Hanson, Gregory R.; Tobin, Ken W.

Issue Date:: 2006-10-10

Research Org.:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1175941

Patent Number(s):: 7119905

Application Number:: 10/649,251

Assignee:: UT-Battelle LLC (Oak Ridge, TN)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS

G - PHYSICS G03 - PHOTOGRAPHY G03F - PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES

Show more

G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
G01B11/0675 - {using interferometry}

G - PHYSICS G03 - PHOTOGRAPHY G03F - PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES
G03F1/26 - Phase shift masks [PSM]
G03F1/84 - Inspecting

G - PHYSICS G03 - PHOTOGRAPHY G03H - HOLOGRAPHIC PROCESSES OR APPARATUS
G03H1/0866 - {Digital holographic imaging, i.e. synthesizing holobjects from holograms}
G03H2001/0456 - {Spatial heterodyne, i.e. filtering a Fourier transform of the off-axis record}
G03H2001/0471 - {Object light being transmitted through the object, e.g. illumination through living cells}
G03H2210/12 - Phase modulating object, e.g. living cell

Show less

DOE Contract Number:: AC05-00OR22725

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: 97 MATHEMATICS AND COMPUTING

Citation Formats


                    Bingham, Philip R., Hanson, Gregory R., and Tobin, Ken W. Spatial-heterodyne interferometry for transmission (SHIFT) measurements.  United States: N. p., 2006. 
        Web.

Copy to clipboard


                    Bingham, Philip R., Hanson, Gregory R., & Tobin, Ken W. Spatial-heterodyne interferometry for transmission (SHIFT) measurements.  United States.

Copy to clipboard


                    Bingham, Philip R., Hanson, Gregory R., and Tobin, Ken W. Tue .  
        "Spatial-heterodyne interferometry for transmission (SHIFT) measurements".  United States.  https://www.osti.gov/servlets/purl/1175941.

Copy to clipboard


                    
@article{osti_1175941,

  title        = {Spatial-heterodyne interferometry for transmission (SHIFT) measurements},

  author       = {Bingham, Philip R. and Hanson, Gregory R. and Tobin, Ken W.},

  abstractNote = {Systems and methods are described for spatial-heterodyne interferometry for transmission (SHIFT) measurements. A method includes digitally recording a spatially-heterodyned hologram including spatial heterodyne fringes for Fourier analysis using a reference beam, and an object beam that is transmitted through an object that is at least partially translucent; Fourier analyzing the digitally recorded spatially-heterodyned hologram, by shifting an original origin of the digitally recorded spatially-heterodyned hologram to sit on top of a spatial-heterodyne carrier frequency defined by an angle between the reference beam and the object beam, to define an analyzed image; digitally filtering the analyzed image to cut off signals around the original origin to define a result; and performing an inverse Fourier transform on the result.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2006},

  month        = {10}

}

Copy to clipboard

Patent:

Save / Share:

Export Metadata

Save to My Library

Works referenced in this record:

Advanced electron holography: a new algorithm for image processing and a standardized quality test for the FEG electron microscope
journal, April 1995

Völkl, E.; Allard, L. F.; Datye, A.
Ultramicroscopy, Vol. 58, Issue 1
https://doi.org/10.1016/0304-3991(94)00182-M

Digital holography for quantitative phase-contrast imaging
journal, January 1999

Cuche, Etienne; Bevilacqua, Frédéric; Depeursinge, Christian
Optics Letters, Vol. 24, Issue 5
https://doi.org/10.1364/OL.24.000291

Direct To Digital Holography For High Aspect Ratio Inspection of Semiconductor Wafers
conference, January 2003

Thomas, C. E. (Tommy)
CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY: 2003 International Conference on Characterization and Metrology for ULSI Technology, AIP Conference Proceedings
https://doi.org/10.1063/1.1622480

Spatial filtering for zero-order and twin-image elimination in digital off-axis holography
journal, January 2000

Cuche, Etienne; Marquet, Pierre; Depeursinge, Christian
Applied Optics, Vol. 39, Issue 23
https://doi.org/10.1364/AO.39.004070

Microscopy by reconstructed wave-fronts
journal, July 1949

Gabor, Dennis
Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, Vol. 197, Issue 1051, p. 454-487
https://doi.org/10.1098/rspa.1949.0075

A software package for the processing and reconstruction of electron holograms
journal, October 1995

VÖLkl, E.; Allard, L. F.; Frost, B.
Journal of Microscopy, Vol. 180, Issue 1
https://doi.org/10.1111/j.1365-2818.1995.tb03655.x

Direct to digital holography for semiconductor wafer defect detection and review
conference, July 2002

Thomas, Jr., C. E.; Bahm, Tracy M.; Baylor, Larry R.
Design, Process Integration, and Characterization for Microelectronics, SPIE Proceedings
https://doi.org/10.1117/12.475659

Wavefront Reconstruction with Diffused Illumination and Three-Dimensional Objects*
journal, January 1964

Leith, Emmett N.; Upatnieks, Juris
Journal of the Optical Society of America, Vol. 54, Issue 11
https://doi.org/10.1364/JOSA.54.001295

Direct phase determination in hologram interferometry with use of digitally recorded holograms
journal, January 1994

Schnars, Ulf
Journal of the Optical Society of America A, Vol. 11, Issue 7
https://doi.org/10.1364/JOSAA.11.002011

Fracional–Fringe Holographic Plasma Interferometry
journal, January 1967

Jahoda, F. C.; Jeffries, R. A.; Sawyer, G. A.
Applied Optics, Vol. 6, Issue 8
https://doi.org/10.1364/AO.6.001407

Reconstructed Wavefronts and Communication Theory*
journal, January 1962

Leith, Emmett N.; Upatnieks, Juris
Journal of the Optical Society of America, Vol. 52, Issue 10
https://doi.org/10.1364/JOSA.52.001123

High-resolution photomask transmission and phase measurement tool
conference, July 2002

Jacob, Jim J.; Litvin, Tim; Merriam, Andrew J.
SPIE's 27th Annual International Symposium on Microlithography, SPIE Proceedings
https://doi.org/10.1117/12.473409

Holographic Interferometry
journal, February 1966

Heflinger, L. O.; Wuerker, R. F.; Brooks, R. E.
Journal of Applied Physics, Vol. 37, Issue 2
https://doi.org/10.1063/1.1708231

Wavefront Reconstruction with Continuous-Tone Objects*
journal, January 1963

Leith, Emmett N.; Upatnieks, Juris
Journal of the Optical Society of America, Vol. 53, Issue 12
https://doi.org/10.1364/JOSA.53.001377

Holographic Interferometry Cookbook
report, January 1972

Jahoda, F. C.; Siemon, R. E.
https://doi.org/10.2172/4601227

Holographic Interferometry
book, January 1994

Rastogi, Pramod K.
Springer Series in Optical Sciences
https://doi.org/10.1007/978-3-540-48078-5

Simultaneous amplitude-contrast and quantitative phase-contrast microscopy by numerical reconstruction of Fresnel off-axis holograms
journal, January 1999

Cuche, Etienne; Marquet, Pierre; Depeursinge, Christian
Applied Optics, Vol. 38, Issue 34
https://doi.org/10.1364/AO.38.006994

The extended Fourier algorithm: Application in discrete optics and electron holography
journal, January 1994

Voelkl, E.; Allard, L. F.
Proceedings, annual meeting, Electron Microscopy Society of America, Vol. 52
https://doi.org/10.1017/S0424820100172322

Similar Records in DOE Patents and OSTI.GOV collections:

Spatial-Heterodyne Interferometry For Reflection And Transm Ission (Shirt) Measurements

Patent Hanson, Gregory R [Clinton, TN]; Bingham, Philip R [Knoxville, TN]; Tobin, Ken W [Harriman, TN]

Systems and methods are described for spatial-heterodyne interferometry for reflection and transmission (SHIRT) measurements. A method includes digitally recording a first spatially-heterodyned hologram using a first reference beam and a first object beam; digitally recording a second spatially-heterodyned hologram using a second reference beam and a second object beam; Fourier analyzing the digitally recorded first spatially-heterodyned hologram to define a first analyzed image; Fourier analyzing the digitally recorded second spatially-heterodyned hologram to define a second analyzed image; digitally filtering the first analyzed image to define a first result; and digitally filtering the second analyzed image to define a second result;more » « less
Full Text Available
Multichannel heterodyning for wideband interferometry, correlation and signal processing

Patent Erskine, David J [Oakland, CA]

A method of signal processing a high bandwidth signal by coherently subdividing it into many narrow bandwidth channels which are individually processed at lower frequencies in a parallel manner. Autocorrelation and correlations can be performed using reference frequencies which may drift slowly with time, reducing cost of device. Coordinated adjustment of channel phases alters temporal and spectral behavior of net signal process more precisely than a channel used individually. This is a method of implementing precision long coherent delays, interferometers, and filters for high bandwidth optical or microwave signals using low bandwidth electronics. High bandwidth signals can be recorded, mathematicallymore » manipulated, and synthesized. « less
Full Text Available
Methods, compositions and kits for imaging cells and tissues using nanoparticles and spatial frequency heterodyne imaging

Patent Rose-Petruck, Christoph; Wands, Jack R.; Rand, Danielle; ...

Methods, compositions, systems, devices and kits are provided herein for preparing and using a nanoparticle composition and spatial frequency heterodyne imaging for visualizing cells or tissues. In various embodiments, the nanoparticle composition includes at least one of: a nanoparticle, a polymer layer, and a binding agent, such that the polymer layer coats the nanoparticle and is for example a polyethylene glycol, a polyelectrolyte, an anionic polymer, or a cationic polymer, and such that the binding agent that specifically binds the cells or the tissue. Methods, compositions, systems, devices and kits are provided for identifying potential therapeutic agents in a modelmore » « less
Full Text Available
Spatially-Heterodyned Holography

Patent Thomas, Clarence E [Knoxville, TN]; Hanson, Gregory R [Clinton, TN]

A method of recording a spatially low-frequency heterodyne hologram, including spatially heterodyne fringes for Fourier analysis, includes: splitting a laser beam into a reference beam and an object beam; interacting the object beam with an object; focusing the reference beam and the object beam at a focal plane of a digital recorder to form a spatially low-frequency heterodyne hologram including spatially heterodyne fringes for Fourier analysis; digital recording the spatially low-frequency heterodyne hologram; Fourier transforming axes of the recorded spatially low-frequency heterodyne hologram including spatially heterodyne fringes in Fourier space to sit on top of a heterodyne carrier frequency definedmore » « less
Full Text Available
Single beam write and/or replay of spatial heterodyne holograms

Patent Thomas, Clarence E. [Knoxville, TN]; Hanson, Gregory R. [Clinton, TN]

A method of writing a spatially heterodyne hologram having spatially heterodyne fringes includes: passing a single write beam through a spatial light modulator that digitally modulates said single write beam; and focusing the single write beam at a focal plane of a lens to impose a holographic diffraction grating pattern on the photorefractive crystal, the holographic diffraction grating pattern including the spatially heterodyne hologram having spatially heterodyne fringes, wherein only said single write beam is incident on said photorefractive crystal without a reference beam. A method of replaying a spatially heterodyne hologram having spatially heterodyne fringes at a replay anglemore » « less
Full Text Available

Similar Records

Title: Spatial-heterodyne interferometry for transmission (SHIFT) measurements

Abstract

Citation Formats

Advanced electron holography: a new algorithm for image processing and a standardized quality test for the FEG electron microscope journal, April 1995

Digital holography for quantitative phase-contrast imaging journal, January 1999

Direct To Digital Holography For High Aspect Ratio Inspection of Semiconductor Wafers conference, January 2003

Spatial filtering for zero-order and twin-image elimination in digital off-axis holography journal, January 2000

Microscopy by reconstructed wave-fronts journal, July 1949

A software package for the processing and reconstruction of electron holograms journal, October 1995

Direct to digital holography for semiconductor wafer defect detection and review conference, July 2002

Wavefront Reconstruction with Diffused Illumination and Three-Dimensional Objects* journal, January 1964

Direct phase determination in hologram interferometry with use of digitally recorded holograms journal, January 1994

Fracional–Fringe Holographic Plasma Interferometry journal, January 1967

Reconstructed Wavefronts and Communication Theory* journal, January 1962

High-resolution photomask transmission and phase measurement tool conference, July 2002

Holographic Interferometry journal, February 1966

Wavefront Reconstruction with Continuous-Tone Objects* journal, January 1963

Holographic Interferometry Cookbook report, January 1972

Holographic Interferometry book, January 1994

Simultaneous amplitude-contrast and quantitative phase-contrast microscopy by numerical reconstruction of Fresnel off-axis holograms journal, January 1999

The extended Fourier algorithm: Application in discrete optics and electron holography journal, January 1994

Advanced electron holography: a new algorithm for image processing and a standardized quality test for the FEG electron microscope
journal, April 1995

Digital holography for quantitative phase-contrast imaging
journal, January 1999

Direct To Digital Holography For High Aspect Ratio Inspection of Semiconductor Wafers
conference, January 2003

Spatial filtering for zero-order and twin-image elimination in digital off-axis holography
journal, January 2000

Microscopy by reconstructed wave-fronts
journal, July 1949

A software package for the processing and reconstruction of electron holograms
journal, October 1995

Direct to digital holography for semiconductor wafer defect detection and review
conference, July 2002

Wavefront Reconstruction with Diffused Illumination and Three-Dimensional Objects*
journal, January 1964

Direct phase determination in hologram interferometry with use of digitally recorded holograms
journal, January 1994

Fracional–Fringe Holographic Plasma Interferometry
journal, January 1967

Reconstructed Wavefronts and Communication Theory*
journal, January 1962

High-resolution photomask transmission and phase measurement tool
conference, July 2002

Holographic Interferometry
journal, February 1966

Wavefront Reconstruction with Continuous-Tone Objects*
journal, January 1963

Holographic Interferometry Cookbook
report, January 1972

Holographic Interferometry
book, January 1994

Simultaneous amplitude-contrast and quantitative phase-contrast microscopy by numerical reconstruction of Fresnel off-axis holograms
journal, January 1999

The extended Fourier algorithm: Application in discrete optics and electron holography
journal, January 1994