Doping-assisted defect control in compound semiconductors
Abstract
The present invention relates to the production of thin film epilayers of III–V and other compounds with acceptor doping wherein the acceptor thermally stabilizes the epilayer, stabilize the naturally incorporated native defect population and therewith maintain the epilayer's beneficial properties upon annealing among other advantageous effects. In particular, balanced doping in which the acceptor concentration is similar to (but does not exceed) the antisite defects in the as-grown material is shown to be particularly advantageous in providing thermal stability, high resistivity and ultrashort trapping times. In particular, MBE growth of LT-GaAs epilayers with balanced Be doping is described in detail. The growth conditions greatly enhance the materials reproducibility (that is, the yield in processed devices). Such growth techniques can be transferred to other III–V materials if the growth conditions are accurately reproduced. Materials produced herein also demonstrate advantages in reproducibility, reliability and radiation hardening.
- Inventors:
- Issue Date:
- Research Org.:
- The United States of America as represented by the Secretary of the Navy, Washington, DC (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1175828
- Patent Number(s):
- 7074697
- Application Number:
- 10/706,610
- Assignee:
- The Regents of the University of California (Oakland, CA); The United States of America as represented by the Secretary of the Navy (Washington, DC)
- Patent Classifications (CPCs):
-
C - CHEMISTRY C30 - CRYSTAL GROWTH C30B - SINGLE-CRYSTAL-GROWTH
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
- DOE Contract Number:
- AC03-76SF00098
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2003 Nov 12
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Specht, Petra, Weber, Eicke R., and Weatherford, Todd Russell. Doping-assisted defect control in compound semiconductors. United States: N. p., 2006.
Web.
Specht, Petra, Weber, Eicke R., & Weatherford, Todd Russell. Doping-assisted defect control in compound semiconductors. United States.
Specht, Petra, Weber, Eicke R., and Weatherford, Todd Russell. Tue .
"Doping-assisted defect control in compound semiconductors". United States. https://www.osti.gov/servlets/purl/1175828.
@article{osti_1175828,
title = {Doping-assisted defect control in compound semiconductors},
author = {Specht, Petra and Weber, Eicke R. and Weatherford, Todd Russell},
abstractNote = {The present invention relates to the production of thin film epilayers of III–V and other compounds with acceptor doping wherein the acceptor thermally stabilizes the epilayer, stabilize the naturally incorporated native defect population and therewith maintain the epilayer's beneficial properties upon annealing among other advantageous effects. In particular, balanced doping in which the acceptor concentration is similar to (but does not exceed) the antisite defects in the as-grown material is shown to be particularly advantageous in providing thermal stability, high resistivity and ultrashort trapping times. In particular, MBE growth of LT-GaAs epilayers with balanced Be doping is described in detail. The growth conditions greatly enhance the materials reproducibility (that is, the yield in processed devices). Such growth techniques can be transferred to other III–V materials if the growth conditions are accurately reproduced. Materials produced herein also demonstrate advantages in reproducibility, reliability and radiation hardening.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2006},
month = {7}
}
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