Method and apparatus for measuring birefringent particles

Bishop, James K.; Guay, Christopher K.

Title: Method and apparatus for measuring birefringent particles

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Abstract

A method and apparatus for measuring birefringent particles is provided comprising a source lamp, a grating, a first polarizer having a first transmission axis, a sample cell and a second polarizer having a second polarization axis. The second polarizer has a second polarization axis that is set to be perpendicular to the first polarization axis, and thereby blocks linearly polarized light with the orientation of the beam of light passing through the first polarizer. The beam of light passing through the second polarizer is measured using a detector.

Inventors:: Bishop, James K.; Guay, Christopher K.

Issue Date:: 2006-04-18

Research Org.:: Univ. of California, Oakland, CA (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1175711

Patent Number(s):: 7030981

Application Number:: 10/215,518

Assignee:: The Regents of the University of California (Oakland, CA)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G - PHYSICS G02 - OPTICS G02B - OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS

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G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/41 - Refractivity
G01N2015/0053 - {in liquids, e.g. trouble}

G - PHYSICS G02 - OPTICS G02B - OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
G02B27/28 - for polarising

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/211 - {Ellipsometry
G01N15/02 - Investigating particle size or size distribution
G01N21/23 - Bi-refringence

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DOE Contract Number:: AC03-76SF000-98

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION

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                    Bishop, James K., and Guay, Christopher K. Method and apparatus for measuring birefringent particles.  United States: N. p., 2006. 
        Web.

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                    Bishop, James K., & Guay, Christopher K. Method and apparatus for measuring birefringent particles.  United States.

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                    Bishop, James K., and Guay, Christopher K. Tue .  
        "Method and apparatus for measuring birefringent particles".  United States.  https://www.osti.gov/servlets/purl/1175711.

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@article{osti_1175711,

  title        = {Method and apparatus for measuring birefringent particles},

  author       = {Bishop, James K. and Guay, Christopher K.},

  abstractNote = {A method and apparatus for measuring birefringent particles is provided comprising a source lamp, a grating, a first polarizer having a first transmission axis, a sample cell and a second polarizer having a second polarization axis. The second polarizer has a second polarization axis that is set to be perpendicular to the first polarization axis, and thereby blocks linearly polarized light with the orientation of the beam of light passing through the first polarizer. The beam of light passing through the second polarizer is measured using a detector.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2006},

  month        = {4}

}

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