Domain epitaxy for thin film growth
Abstract
A method of forming an epitaxial film on a substrate includes growing an initial layer of a film on a substrate at a temperature T.sub.growth, said initial layer having a thickness h and annealing the initial layer of the film at a temperature T.sub.anneal, thereby relaxing the initial layer, wherein said thickness h of the initial layer of the film is greater than a critical thickness h.sub.c. The method further includes growing additional layers of the epitaxial film on the initial layer subsequent to annealing. In some embodiments, the method further includes growing a layer of the film that includes at least one amorphous island.
- Inventors:
- Issue Date:
- Research Org.:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1175528
- Patent Number(s):
- 6955985
- Application Number:
- 10/608,780
- Assignee:
- Kopin Corporation (Taunton, MA)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
C - CHEMISTRY C30 - CRYSTAL GROWTH C30B - SINGLE-CRYSTAL-GROWTH
- DOE Contract Number:
- AC05-00OR22725
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Narayan, Jagdish. Domain epitaxy for thin film growth. United States: N. p., 2005.
Web.
Narayan, Jagdish. Domain epitaxy for thin film growth. United States.
Narayan, Jagdish. Tue .
"Domain epitaxy for thin film growth". United States. https://www.osti.gov/servlets/purl/1175528.
@article{osti_1175528,
title = {Domain epitaxy for thin film growth},
author = {Narayan, Jagdish},
abstractNote = {A method of forming an epitaxial film on a substrate includes growing an initial layer of a film on a substrate at a temperature T.sub.growth, said initial layer having a thickness h and annealing the initial layer of the film at a temperature T.sub.anneal, thereby relaxing the initial layer, wherein said thickness h of the initial layer of the film is greater than a critical thickness h.sub.c. The method further includes growing additional layers of the epitaxial film on the initial layer subsequent to annealing. In some embodiments, the method further includes growing a layer of the film that includes at least one amorphous island.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2005},
month = {10}
}
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