Method and apparatus for detecting the presence and thickness of carbon and oxide layers on EUV reflective surfaces
Abstract
The characteristics of radiation that is reflected from carbon deposits and oxidation formations on highly reflective surfaces such as Mo/Si mirrors can be quantified and employed to detect and measure the presence of such impurities on optics. Specifically, it has been shown that carbon deposits on a Mo/Si multilayer mirror decreases the intensity of reflected HeNe laser (632.8 nm) light. In contrast, oxide layers formed on the mirror should cause an increase in HeNe power reflection. Both static measurements and real-time monitoring of carbon and oxide surface impurities on optical elements in lithography tools should be achievable.
- Inventors:
- Issue Date:
- Research Org.:
- Sandia National Lab. (SNL-CA), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1175219
- Patent Number(s):
- 6847463
- Application Number:
- 10/163,477
- Assignee:
- EUV, LLC (Santa Clara, CA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING
Citation Formats
Malinowski, Michael E. Method and apparatus for detecting the presence and thickness of carbon and oxide layers on EUV reflective surfaces. United States: N. p., 2005.
Web.
Malinowski, Michael E. Method and apparatus for detecting the presence and thickness of carbon and oxide layers on EUV reflective surfaces. United States.
Malinowski, Michael E. Tue .
"Method and apparatus for detecting the presence and thickness of carbon and oxide layers on EUV reflective surfaces". United States. https://www.osti.gov/servlets/purl/1175219.
@article{osti_1175219,
title = {Method and apparatus for detecting the presence and thickness of carbon and oxide layers on EUV reflective surfaces},
author = {Malinowski, Michael E.},
abstractNote = {The characteristics of radiation that is reflected from carbon deposits and oxidation formations on highly reflective surfaces such as Mo/Si mirrors can be quantified and employed to detect and measure the presence of such impurities on optics. Specifically, it has been shown that carbon deposits on a Mo/Si multilayer mirror decreases the intensity of reflected HeNe laser (632.8 nm) light. In contrast, oxide layers formed on the mirror should cause an increase in HeNe power reflection. Both static measurements and real-time monitoring of carbon and oxide surface impurities on optical elements in lithography tools should be achievable.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2005},
month = {1}
}
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