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Title: Lithography process for patterning HgI2 photonic devices

Abstract

A photolithographic process forms patterns on HgI.sub.2 surfaces and defines metal sublimation masks and electrodes to substantially improve device performance by increasing the realizable design space. Techniques for smoothing HgI.sub.2 surfaces and for producing trenches in HgI.sub.2 are provided. A sublimation process is described which produces etched-trench devices with enhanced electron-transport-only behavior.

Inventors:
; ;
Issue Date:
Research Org.:
Sandia National Lab. (SNL-CA), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1175146
Patent Number(s):
6821714
Application Number:
09/712,082
Assignee:
Sandia National Laboratories
Patent Classifications (CPCs):
G - PHYSICS G03 - PHOTOGRAPHY G03F - PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Mescher, Mark J., James, Ralph B., and Hermon, Haim. Lithography process for patterning HgI2 photonic devices. United States: N. p., 2004. Web.
Mescher, Mark J., James, Ralph B., & Hermon, Haim. Lithography process for patterning HgI2 photonic devices. United States.
Mescher, Mark J., James, Ralph B., and Hermon, Haim. Tue . "Lithography process for patterning HgI2 photonic devices". United States. https://www.osti.gov/servlets/purl/1175146.
@article{osti_1175146,
title = {Lithography process for patterning HgI2 photonic devices},
author = {Mescher, Mark J. and James, Ralph B. and Hermon, Haim},
abstractNote = {A photolithographic process forms patterns on HgI.sub.2 surfaces and defines metal sublimation masks and electrodes to substantially improve device performance by increasing the realizable design space. Techniques for smoothing HgI.sub.2 surfaces and for producing trenches in HgI.sub.2 are provided. A sublimation process is described which produces etched-trench devices with enhanced electron-transport-only behavior.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2004},
month = {11}
}