Macroscopic model of scanning force microscope
Abstract
A macroscopic version of the Scanning Force Microscope is described. It consists of a cantilever under the influence of external forces, which mimic the tip-sample interactions. The use of this piece of equipment is threefold. First, it serves as direct way to understand the parts and functions of the Scanning Force Microscope, and thus it is effectively used as an instructional tool. Second, due to its large size, it allows for simple measurements of applied forces and parameters that define the state of motion of the system. This information, in turn, serves to compare the interaction forces with the reconstructed ones, which cannot be done directly with the standard microscopic set up. Third, it provides a kinematics method to non-destructively measure elastic constants of materials, such as Young's and shear modules, with special application for brittle materials.
- Inventors:
- Issue Date:
- Research Org.:
- University Of Puerto Rico, San Juan, PR
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1175059
- Patent Number(s):
- 6799464
- Application Number:
- 09/800,805
- Assignee:
- University Of Puerto Rico
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
- DOE Contract Number:
- FG02-98-ER-45729
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Guerra-Vela, Claudio, and Zypman, Fredy R. Macroscopic model of scanning force microscope. United States: N. p., 2004.
Web.
Guerra-Vela, Claudio, & Zypman, Fredy R. Macroscopic model of scanning force microscope. United States.
Guerra-Vela, Claudio, and Zypman, Fredy R. Tue .
"Macroscopic model of scanning force microscope". United States. https://www.osti.gov/servlets/purl/1175059.
@article{osti_1175059,
title = {Macroscopic model of scanning force microscope},
author = {Guerra-Vela, Claudio and Zypman, Fredy R.},
abstractNote = {A macroscopic version of the Scanning Force Microscope is described. It consists of a cantilever under the influence of external forces, which mimic the tip-sample interactions. The use of this piece of equipment is threefold. First, it serves as direct way to understand the parts and functions of the Scanning Force Microscope, and thus it is effectively used as an instructional tool. Second, due to its large size, it allows for simple measurements of applied forces and parameters that define the state of motion of the system. This information, in turn, serves to compare the interaction forces with the reconstructed ones, which cannot be done directly with the standard microscopic set up. Third, it provides a kinematics method to non-destructively measure elastic constants of materials, such as Young's and shear modules, with special application for brittle materials.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2004},
month = {10}
}