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Title: High throughput microcantilever detector

Abstract

In an improved uncoated microcantilever detector, the sample sites are placed on a separate semi-conducting substrate and the microcantilever element detects and measures the changes before and after a chemical interaction or hybridization of the sites by sensing differences of phase angle between an alternating voltage applied to the microcantilever element and vibration of the microcantilever element. In another embodiment of the invention, multiple sample sites are on a sample array wherein an array of microcantilever elements detect and measure the change before and after chemical interactions or hybridizations of the sample sites.

Inventors:
; ; ;
Issue Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1174950
Patent Number(s):
6763705
Application Number:
10/462,249
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Thundat, Thomas G., Ferrell, Thomas L., Hansen, Karolyn M., and Tian, Fang. High throughput microcantilever detector. United States: N. p., 2004. Web.
Thundat, Thomas G., Ferrell, Thomas L., Hansen, Karolyn M., & Tian, Fang. High throughput microcantilever detector. United States.
Thundat, Thomas G., Ferrell, Thomas L., Hansen, Karolyn M., and Tian, Fang. Tue . "High throughput microcantilever detector". United States. https://www.osti.gov/servlets/purl/1174950.
@article{osti_1174950,
title = {High throughput microcantilever detector},
author = {Thundat, Thomas G. and Ferrell, Thomas L. and Hansen, Karolyn M. and Tian, Fang},
abstractNote = {In an improved uncoated microcantilever detector, the sample sites are placed on a separate semi-conducting substrate and the microcantilever element detects and measures the changes before and after a chemical interaction or hybridization of the sites by sensing differences of phase angle between an alternating voltage applied to the microcantilever element and vibration of the microcantilever element. In another embodiment of the invention, multiple sample sites are on a sample array wherein an array of microcantilever elements detect and measure the change before and after chemical interactions or hybridizations of the sample sites.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2004},
month = {7}
}

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Works referenced in this record:

Parallel atomic force microscopy using cantilevers with integrated piezoresistive sensors and integrated piezoelectric actuators
journal, December 1995


Cantilever-Based Optical Deflection Assay for Discrimination of DNA Single-Nucleotide Mismatches
journal, April 2001


Atomic resolution with an atomic force microscope using piezoresistive detection
journal, February 1993