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Title: Line sensing device for ultrafast laser acoustic inspection using adaptive optics

Abstract

Apparatus and method for inspecting thin film specimens along a line. A laser emits pulses of light that are split into first, second, third and fourth portions. A delay is introduced into the first portion of pulses and the first portion of pulses is directed onto a thin film specimen along a line. The third portion of pulses is directed onto the thin film specimen along the line. A delay is introduced into the fourth portion of pulses and the delayed fourth portion of pulses are directed to a photorefractive crystal. Pulses of light reflected from the thin film specimen are directed to the photorefractive crystal. Light from the photorefractive crystal is collected and transmitted to a linear photodiode array allowing inspection of the thin film specimens along a line.

Inventors:
;
Issue Date:
Research Org.:
The Regents of the University of California, Los Alamos, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1174565
Patent Number(s):
6,643,005
Application Number:
10/096,166
Assignee:
The Regents of the University of California (Los Alamos, NM) OSTI
DOE Contract Number:  
W-7405-ENG36
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS

Citation Formats

Hale, Thomas C., and Moore, David S. Line sensing device for ultrafast laser acoustic inspection using adaptive optics. United States: N. p., 2003. Web.
Hale, Thomas C., & Moore, David S. Line sensing device for ultrafast laser acoustic inspection using adaptive optics. United States.
Hale, Thomas C., and Moore, David S. Tue . "Line sensing device for ultrafast laser acoustic inspection using adaptive optics". United States. https://www.osti.gov/servlets/purl/1174565.
@article{osti_1174565,
title = {Line sensing device for ultrafast laser acoustic inspection using adaptive optics},
author = {Hale, Thomas C. and Moore, David S.},
abstractNote = {Apparatus and method for inspecting thin film specimens along a line. A laser emits pulses of light that are split into first, second, third and fourth portions. A delay is introduced into the first portion of pulses and the first portion of pulses is directed onto a thin film specimen along a line. The third portion of pulses is directed onto the thin film specimen along the line. A delay is introduced into the fourth portion of pulses and the delayed fourth portion of pulses are directed to a photorefractive crystal. Pulses of light reflected from the thin film specimen are directed to the photorefractive crystal. Light from the photorefractive crystal is collected and transmitted to a linear photodiode array allowing inspection of the thin film specimens along a line.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2003},
month = {11}
}

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