skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Mass spectrometer with electron source for reducing space charge effects in sample beam

Abstract

A mass spectrometer includes an ion source which generates a beam including positive ions, a sampling interface which extracts a portion of the beam from the ion source to form a sample beam that travels along a path and has an excess of positive ions over at least part of the path, thereby causing space charge effects to occur in the sample beam due to the excess of positive ions in the sample beam, an electron source which adds electrons to the sample beam to reduce space charge repulsion between the positive ions in the sample beam, thereby reducing the space charge effects in the sample beam and producing a sample beam having reduced space charge effects, and a mass analyzer which analyzes the sample beam having reduced space charge effects.

Inventors:
;
Issue Date:
Research Org.:
Iowa State University Research Foundation, Inc., Ames, IA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1174535
Patent Number(s):
6,633,114
Application Number:
09/758,391
Assignee:
Iowa State University Research Foundation, Inc. (Ames, IA) OSTI
DOE Contract Number:  
W-7405-ENG-82
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Citation Formats

Houk, Robert S., and Praphairaksit, Narong. Mass spectrometer with electron source for reducing space charge effects in sample beam. United States: N. p., 2003. Web.
Houk, Robert S., & Praphairaksit, Narong. Mass spectrometer with electron source for reducing space charge effects in sample beam. United States.
Houk, Robert S., and Praphairaksit, Narong. Tue . "Mass spectrometer with electron source for reducing space charge effects in sample beam". United States. https://www.osti.gov/servlets/purl/1174535.
@article{osti_1174535,
title = {Mass spectrometer with electron source for reducing space charge effects in sample beam},
author = {Houk, Robert S. and Praphairaksit, Narong},
abstractNote = {A mass spectrometer includes an ion source which generates a beam including positive ions, a sampling interface which extracts a portion of the beam from the ion source to form a sample beam that travels along a path and has an excess of positive ions over at least part of the path, thereby causing space charge effects to occur in the sample beam due to the excess of positive ions in the sample beam, an electron source which adds electrons to the sample beam to reduce space charge repulsion between the positive ions in the sample beam, thereby reducing the space charge effects in the sample beam and producing a sample beam having reduced space charge effects, and a mass analyzer which analyzes the sample beam having reduced space charge effects.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2003},
month = {10}
}

Patent:

Save / Share: