Mass spectrometer with electron source for reducing space charge effects in sample beam
Abstract
A mass spectrometer includes an ion source which generates a beam including positive ions, a sampling interface which extracts a portion of the beam from the ion source to form a sample beam that travels along a path and has an excess of positive ions over at least part of the path, thereby causing space charge effects to occur in the sample beam due to the excess of positive ions in the sample beam, an electron source which adds electrons to the sample beam to reduce space charge repulsion between the positive ions in the sample beam, thereby reducing the space charge effects in the sample beam and producing a sample beam having reduced space charge effects, and a mass analyzer which analyzes the sample beam having reduced space charge effects.
- Inventors:
- Issue Date:
- Research Org.:
- Iowa State Univ., Ames, IA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1174535
- Patent Number(s):
- 6633114
- Application Number:
- 09/758,391
- Assignee:
- Iowa State University Research Foundation, Inc. (Ames, IA)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- W-7405-ENG-82
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
Citation Formats
Houk, Robert S., and Praphairaksit, Narong. Mass spectrometer with electron source for reducing space charge effects in sample beam. United States: N. p., 2003.
Web.
Houk, Robert S., & Praphairaksit, Narong. Mass spectrometer with electron source for reducing space charge effects in sample beam. United States.
Houk, Robert S., and Praphairaksit, Narong. Tue .
"Mass spectrometer with electron source for reducing space charge effects in sample beam". United States. https://www.osti.gov/servlets/purl/1174535.
@article{osti_1174535,
title = {Mass spectrometer with electron source for reducing space charge effects in sample beam},
author = {Houk, Robert S. and Praphairaksit, Narong},
abstractNote = {A mass spectrometer includes an ion source which generates a beam including positive ions, a sampling interface which extracts a portion of the beam from the ion source to form a sample beam that travels along a path and has an excess of positive ions over at least part of the path, thereby causing space charge effects to occur in the sample beam due to the excess of positive ions in the sample beam, an electron source which adds electrons to the sample beam to reduce space charge repulsion between the positive ions in the sample beam, thereby reducing the space charge effects in the sample beam and producing a sample beam having reduced space charge effects, and a mass analyzer which analyzes the sample beam having reduced space charge effects.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2003},
month = {10}
}
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