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Title: Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution

Abstract

A highly sensitive and high resolution magnetic microscope images magnetic properties quantitatively. Imaging is done with a modified transmission electron microscope that allows imaging of the sample in a zero magnetic field. Two images from closely spaced planes, one in focus and one slightly out of focus, are sufficient to calculate the absolute values of the phase change imparted to the electrons, and hence obtain the magnetization vector field distribution.

Inventors:
Issue Date:
Research Org.:
Univ. of California, Oakland, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1174393
Patent Number(s):
6590209
Application Number:
09/516,878
Assignee:
The Regents of the University of California (Oakland, CA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Bajt, Sasa. Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution. United States: N. p., 2003. Web.
Bajt, Sasa. Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution. United States.
Bajt, Sasa. Tue . "Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution". United States. https://www.osti.gov/servlets/purl/1174393.
@article{osti_1174393,
title = {Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution},
author = {Bajt, Sasa},
abstractNote = {A highly sensitive and high resolution magnetic microscope images magnetic properties quantitatively. Imaging is done with a modified transmission electron microscope that allows imaging of the sample in a zero magnetic field. Two images from closely spaced planes, one in focus and one slightly out of focus, are sufficient to calculate the absolute values of the phase change imparted to the electrons, and hence obtain the magnetization vector field distribution.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2003},
month = {7}
}

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Works referenced in this record:

Noninterferometric Phase Imaging with Partially Coherent Light
journal, March 1998


Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy
journal, December 1992


Practical Image Restoration of Thick Biological Specimens Using Multiple Focus Levels in Transmission Electron Microscopy
journal, December 1997


Quantitative phase-sensitive imaging in a transmission electron microscope
journal, May 2000