skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution

Abstract

A highly sensitive and high resolution magnetic microscope images magnetic properties quantitatively. Imaging is done with a modified transmission electron microscope that allows imaging of the sample in a zero magnetic field. Two images from closely spaced planes, one in focus and one slightly out of focus, are sufficient to calculate the absolute values of the phase change imparted to the electrons, and hence obtain the magnetization vector field distribution.

Inventors:
Issue Date:
Research Org.:
The Regents of the University of California, Oakland, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1174393
Patent Number(s):
6,590,209
Application Number:
09/516,878
Assignee:
The Regents of the University of California (Oakland, CA) OSTI
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Bajt, Sasa. Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution. United States: N. p., 2003. Web.
Bajt, Sasa. Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution. United States.
Bajt, Sasa. Tue . "Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution". United States. https://www.osti.gov/servlets/purl/1174393.
@article{osti_1174393,
title = {Technique to quantitatively measure magnetic properties of thin structures at <10 NM spatial resolution},
author = {Bajt, Sasa},
abstractNote = {A highly sensitive and high resolution magnetic microscope images magnetic properties quantitatively. Imaging is done with a modified transmission electron microscope that allows imaging of the sample in a zero magnetic field. Two images from closely spaced planes, one in focus and one slightly out of focus, are sufficient to calculate the absolute values of the phase change imparted to the electrons, and hence obtain the magnetization vector field distribution.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2003},
month = {7}
}

Patent:

Save / Share: