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Title: Optical method for the determination of grain orientation in films

Abstract

A method for the determination of grain orientation in a film sample is provided comprising the steps of measuring a first transient optical response of the film and determining the contribution to the transient optical response arising from a change in the energy distribution of the electrons in the sample, determining the contribution to the transient optical response arising from a propagating strain pulse within the sample, and determining the contribution to the transient optical response arising from a change in sample temperature of the sample. The grain orientation of the sample may be determined using the contributions to the transient optical response arising from the change in the energy distribution of the electrons, the propagating strain pulse, and the change in sample temperature. Additionally, a method for determination of the thickness of a film sample is provided. The grain orientation of the sample is first determined. The grain orientation, together with the velocity of sound and a propagation time of a strain pulse through the sample are then used to determine the thickness of the film sample.

Inventors:
Issue Date:
Research Org.:
Brown University Research Foundation, Providence, RI (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1174326
Patent Number(s):
6,563,591
Application Number:
10/012,985
Assignee:
Brown University Research Foundation (Providence, RI) OSTI
DOE Contract Number:  
FG02-86ER45267
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Maris, Humphrey J. Optical method for the determination of grain orientation in films. United States: N. p., 2003. Web.
Maris, Humphrey J. Optical method for the determination of grain orientation in films. United States.
Maris, Humphrey J. Tue . "Optical method for the determination of grain orientation in films". United States. https://www.osti.gov/servlets/purl/1174326.
@article{osti_1174326,
title = {Optical method for the determination of grain orientation in films},
author = {Maris, Humphrey J.},
abstractNote = {A method for the determination of grain orientation in a film sample is provided comprising the steps of measuring a first transient optical response of the film and determining the contribution to the transient optical response arising from a change in the energy distribution of the electrons in the sample, determining the contribution to the transient optical response arising from a propagating strain pulse within the sample, and determining the contribution to the transient optical response arising from a change in sample temperature of the sample. The grain orientation of the sample may be determined using the contributions to the transient optical response arising from the change in the energy distribution of the electrons, the propagating strain pulse, and the change in sample temperature. Additionally, a method for determination of the thickness of a film sample is provided. The grain orientation of the sample is first determined. The grain orientation, together with the velocity of sound and a propagation time of a strain pulse through the sample are then used to determine the thickness of the film sample.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2003},
month = {5}
}

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