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Title: Electrostatic MEMS devices with high reliability

Abstract

The present invention provides for an electrostatic microelectromechanical (MEMS) device comprising a dielectric layer separating a first conductor and a second conductor. The first conductor is moveable towards the second conductor, when a voltage is applied to the MEMS device. The dielectric layer recovers from dielectric charging failure almost immediately upon removal of the voltage from the MEMS device.

Inventors:
; ; ; ; ; ; ; ;
Issue Date:
Research Org.:
Univ. of Wisconsin, Madison, WI (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1170735
Patent Number(s):
8963659
Application Number:
13/114,945
Assignee:
Goldsmith,Charles L. (Plano, TX)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01H - ELECTRIC SWITCHES
H - ELECTRICITY H03 - BASIC ELECTRONIC CIRCUITRY H03K - PULSE TECHNIQUE
DOE Contract Number:  
FG02-02ER46016
Resource Type:
Patent
Resource Relation:
Patent File Date: 2011 May 24
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING

Citation Formats

Goldsmith, Charles L, Auciello, Orlando H, Sumant, Anirudha V, Mancini, Derrick C, Gudeman, Chris, Sampath, Suresh, Carlilse, John A, Carpick, Robert W, and Hwang, James. Electrostatic MEMS devices with high reliability. United States: N. p., 2015. Web.
Goldsmith, Charles L, Auciello, Orlando H, Sumant, Anirudha V, Mancini, Derrick C, Gudeman, Chris, Sampath, Suresh, Carlilse, John A, Carpick, Robert W, & Hwang, James. Electrostatic MEMS devices with high reliability. United States.
Goldsmith, Charles L, Auciello, Orlando H, Sumant, Anirudha V, Mancini, Derrick C, Gudeman, Chris, Sampath, Suresh, Carlilse, John A, Carpick, Robert W, and Hwang, James. Tue . "Electrostatic MEMS devices with high reliability". United States. https://www.osti.gov/servlets/purl/1170735.
@article{osti_1170735,
title = {Electrostatic MEMS devices with high reliability},
author = {Goldsmith, Charles L and Auciello, Orlando H and Sumant, Anirudha V and Mancini, Derrick C and Gudeman, Chris and Sampath, Suresh and Carlilse, John A and Carpick, Robert W and Hwang, James},
abstractNote = {The present invention provides for an electrostatic microelectromechanical (MEMS) device comprising a dielectric layer separating a first conductor and a second conductor. The first conductor is moveable towards the second conductor, when a voltage is applied to the MEMS device. The dielectric layer recovers from dielectric charging failure almost immediately upon removal of the voltage from the MEMS device.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Feb 24 00:00:00 EST 2015},
month = {Tue Feb 24 00:00:00 EST 2015}
}

Works referenced in this record:

Micromechanical microwave switching
patent, April 1997


Method and apparatus for switching high frequency signals
patent, May 2002


Proximity micro-electro-mechanical system
patent, August 2003


Method and apparatus for switching high frequency signals
patent, March 2004


Capacitive type microelectromechanical RF switch
patent, August 2004


Micromechanical membrane switches for microwave applications
conference, January 1995


Characteristics of micromachined switches at microwave frequencies
conference, January 1996


Performance of low-loss RF MEMS capacitive switches
journal, January 1998


Temperature Acceleration of Dielectric Charging in RF MEMS Capacitive Switches
conference, June 2006


Acceleration of Dielectric Charging in RF MEMS Capacitive Switches
journal, January 2006