Systems and methods for sample analysis
Abstract
The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.
- Inventors:
- Issue Date:
- Research Org.:
- Purdue Research Foundation, West Lafayette, IN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1167213
- Patent Number(s):
- 8,932,875
- Application Number:
- 13/977,758
- Assignee:
- Purdue Research Foundation (West Lafayette, IN)
- DOE Contract Number:
- FG02-06ER15807
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2011 Dec 29
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING
Citation Formats
Cooks, Robert Graham, Li, Guangtao, Li, Xin, and Ouyang, Zheng. Systems and methods for sample analysis. United States: N. p., 2015.
Web.
Cooks, Robert Graham, Li, Guangtao, Li, Xin, & Ouyang, Zheng. Systems and methods for sample analysis. United States.
Cooks, Robert Graham, Li, Guangtao, Li, Xin, and Ouyang, Zheng. Tue .
"Systems and methods for sample analysis". United States. https://www.osti.gov/servlets/purl/1167213.
@article{osti_1167213,
title = {Systems and methods for sample analysis},
author = {Cooks, Robert Graham and Li, Guangtao and Li, Xin and Ouyang, Zheng},
abstractNote = {The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2015},
month = {1}
}
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