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Title: Systems and methods for sample analysis

The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.
Inventors:
; ; ;
Issue Date:
OSTI Identifier:
1167213
Assignee:
Purdue Research Foundation (West Lafayette, IN) CHO
Patent Number(s):
8,932,875
Application Number:
13/977,758
Contract Number:
FG02-06ER15807
Resource Relation:
Patent File Date: 2011 Dec 29
Research Org:
Purdue Research Foundation, West Lafayette, IN (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING

Works referenced in this record:

Electrospray: Principles and Practice
journal, July 1997

Ionic liquid ion sources: characterization of externally wetted emitters
journal, February 2005
  • Lozano, Paulo; Martínez-Sánchez, Manuel
  • Journal of Colloid and Interface Science, Vol. 282, Issue 2, p. 415-421
  • DOI: 10.1016/j.jcis.2004.08.132