Systems and methods for sample analysis

Title: Systems and methods for sample analysis

Abstract

The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.

Inventors:: Cooks, Robert Graham; Li, Guangtao; Li, Xin; Ouyang, Zheng

Issue Date:: 2015-01-13

Research Org.:: Purdue Univ., West Lafayette, IN (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1167213

Patent Number(s):: 8932875

Application Number:: 13/977,758

Assignee:: Purdue Research Foundation (West Lafayette, IN)

Patent Classifications (CPCs):: H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10T - TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION

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H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J49/0031 - {Step by step routines describing the use of the apparatus

Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10T - TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
Y10T436/25875 - Gaseous sample or with change of physical state

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J49/0459 - {for solid samples}
H01J49/42 - Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
H01J49/06 - Electron- or ion-optical arrangements
H01J49/0431 - {for liquid samples

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N33/28 - Oils {, i.e. hydrocarbon liquids}

Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10T - TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
Y10T436/24 - Nuclear magnetic resonance, electron spin resonance or other spin effects or mass spectrometry
Y10T436/214 - Acyclic [e.g., methane, octane, isoparaffin, etc.]

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DOE Contract Number:: FG02-06ER15807

Resource Type:: Patent

Resource Relation:: Patent File Date: 2011 Dec 29

Country of Publication:: United States

Language:: English

Subject:: 42 ENGINEERING

Citation Formats


                    Cooks, Robert Graham, Li, Guangtao, Li, Xin, and Ouyang, Zheng. Systems and methods for sample analysis.  United States: N. p., 2015. 
        Web.

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                    Cooks, Robert Graham, Li, Guangtao, Li, Xin, & Ouyang, Zheng. Systems and methods for sample analysis.  United States.

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                    Cooks, Robert Graham, Li, Guangtao, Li, Xin, and Ouyang, Zheng. Tue .  
        "Systems and methods for sample analysis".  United States.  https://www.osti.gov/servlets/purl/1167213.

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@article{osti_1167213,

  title        = {Systems and methods for sample analysis},

  author       = {Cooks, Robert Graham and Li, Guangtao and Li, Xin and Ouyang, Zheng},

  abstractNote = {The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2015},

  month        = {1}

}

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Works referenced in this record:

Ionic liquid ion sources: characterization of externally wetted emitters
journal, February 2005

Lozano, Paulo; Martínez-Sánchez, Manuel
Journal of Colloid and Interface Science, Vol. 282, Issue 2, p. 415-421
https://doi.org/10.1016/j.jcis.2004.08.132

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Title: Systems and methods for sample analysis

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Citation Formats

Ionic liquid ion sources: characterization of externally wetted emitters journal, February 2005

Ionic liquid ion sources: characterization of externally wetted emitters
journal, February 2005