Systems and methods for sample analysis

Title: Systems and methods for sample analysis

The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.

Inventors:: Cooks, Robert Graham; Li, Guangtao; Li, Xin; Ouyang, Zheng

Issue Date:: 2015-01-13

OSTI Identifier:: 1167213

Assignee:: Purdue Research Foundation (West Lafayette, IN) CHO

Patent Number(s):: 8,932,875

Application Number:: 13/977,758

Contract Number:: FG02-06ER15807

Resource Relation:: Patent File Date: 2011 Dec 29

Research Org:: Purdue Research Foundation, West Lafayette, IN (United States)

Sponsoring Org:: USDOE

Country of Publication:: United States

Language:: English

Subject:: 42 ENGINEERING

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Other works cited in this record:

Electrospray: Principles and Practice
journal, July 1997

Gaskell, Simon J.
Journal of Mass Spectrometry, Vol. 32, Issue 7, p. 677-688
DOI: 10.1002/(SICI)1096-9888(199707)32:7<677::AID-JMS536>3.0.CO;2-G

Ionic liquid ion sources: characterization of externally wetted emitters
journal, February 2005

Lozano, Paulo; Martínez-Sánchez, Manuel
Journal of Colloid and Interface Science, Vol. 282, Issue 2, p. 415-421
DOI: 10.1016/j.jcis.2004.08.132

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