Method of collecting and processing electron diffraction data
Abstract
A method of using electron diffraction to obtain PDFs from crystalline, nanocrystalline, and amorphous inorganic, organic, and organometallic compound.
- Inventors:
- Issue Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1166756
- Patent Number(s):
- 8921783
- Application Number:
- 14/160,185
- Assignee:
- The Trustees of Columbia University in the City of New York (New York, NY)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- AC02-98CH10886
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2014 Jan 21
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 47 OTHER INSTRUMENTATION
Citation Formats
Billinge, Simon, Farrow, Christopher, Gorelik, Tatiana E, Kanatzidis, Mercouri, and Schmidt, Martin U. Method of collecting and processing electron diffraction data. United States: N. p., 2014.
Web.
Billinge, Simon, Farrow, Christopher, Gorelik, Tatiana E, Kanatzidis, Mercouri, & Schmidt, Martin U. Method of collecting and processing electron diffraction data. United States.
Billinge, Simon, Farrow, Christopher, Gorelik, Tatiana E, Kanatzidis, Mercouri, and Schmidt, Martin U. Tue .
"Method of collecting and processing electron diffraction data". United States. https://www.osti.gov/servlets/purl/1166756.
@article{osti_1166756,
title = {Method of collecting and processing electron diffraction data},
author = {Billinge, Simon and Farrow, Christopher and Gorelik, Tatiana E and Kanatzidis, Mercouri and Schmidt, Martin U},
abstractNote = {A method of using electron diffraction to obtain PDFs from crystalline, nanocrystalline, and amorphous inorganic, organic, and organometallic compound.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {12}
}
Works referenced in this record:
Method and apparatus for measuring thermal diffusivity by ac joule-heating
patent, January 1992
- Hashimoto, Toshimasa; Miyamoto, Akira; Shizuka, Kohei
- US Patent Document 5,080,495
Method of and device for determining the polymerization profile of a polymeric layer
patent, July 1997
- Grego, Giorgio; Tallone, Luigi
- US Patent Document 5,644,391
Metallo organo liquid crystals in a polymer matrix
patent, December 1998
- Hakemi, Hussan Ali
- US Patent Document 5,843,333
Field assisted transformation of chemical and material compositions
patent, July 2001
- Yadav, Tapesh; Meramadi, Bijan K.
- US Patent Document 6,267,864
Electron detectors
patent, May 2003
- El Gomati, Mohamed Mochtar; Frank, Ludek; Mullerova, Ilona
- US Patent Document 6,570,163
Observation apparatus and observation method using an electron beam
patent, June 2004
- Koguchi, Masanari; Nakamura, Kuniyasu; Umemura, Kaoru
- US Patent Document 6,750,451
Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope
patent, January 2006
- Moses, Elisha; Zik, Ory; Thiberge, Stephan
- US Patent Document 6,989,542
Standard sample for transmission electron microscope (TEM) elemental mapping and TEM elemetal mapping method using the same
patent, May 2006
- Park, Gyeong Su; Kaji, Kazutoshi; Park, Jong-bong
- US Patent Document 7,053,372
Method and device for measuring electron diffraction of a sample
patent, December 2011
- Koch, Christoph
- US Patent Document 8,076,640
Methods and devices for high throughput crystal structure analysis by electron diffraction
patent, August 2012
- Nicolopoulos, Stavros; Bultreys, Daniel; Rauch, Edgard
- US Patent Document 8,253,099
Pigmented cosmetic compositions
patent-application, July 2003
- Pahlck, Harold; Lee, Christian J.; Cupolo, Dennis
- US Patent Application 10/329647; 20030124077
Chemical prefiltering for phase differentiation via simultaneous energy dispersive spectrometry and electron backscatter diffraction
patent-application, January 2004
- Wright, Stuart Ian; Nowell, Matthew McBride; Dingley, David Joseph
- US Patent Application 10/439346; 20040011958
Electron beam applying apparatus and drawing apparatus
patent-application, April 2007
- Miyazaki, Takeshi; Ohyi, Hideyuki; Obara, Takashi
- US Patent Application 10/571776; 20070085003
Analysis and Screening of Solid Forms Using the Atomic Pair Distribution Function
patent-application, October 2007
- Bates, Simon; Ivanisevic, Igor
- US Patent Application 10/590204; 20070243620
Beam Apparatus
patent-application, June 2008
- Saito, Manabu
- US Patent Application 11/961263; 20080149831
Methods and Apparatus for Spectroscopic Imaging of Materials in an Array
patent-application, January 2009
- McFarland, Eric W.; Archibald, William
- US Patent Application 12/110562; 20090002708
Processing Materials with Ion Beams
patent-application, January 2010
- Marshall, Medoff
- US Patent Application 12/486436; 20100000853
Apparatus and Method Including a Direct Bombardment Detector and a Secondary Detector for Use in Electron Microscopy
patent-application, February 2010
- Bilhorn, Rober B.
- US Patent Application 12/184995; 20100025579
Scanning Transmission Electron Microscope Using Gas Amplification
patent-application, May 2010
- Toth, Milos; Knowles, Rae; Knowles, William Ralph
- US Patent Application 12/264805; 20100108881
Characterization of Nanoscale Structures Using an Ultrafast Electron Microscope
patent-application, May 2010
- Zewail, Ahmed H.
- US Patent Application 12/575312; 20100108883
Method and Device for Measuring Electron Diffraction of a Sample
patent-application, March 2011
- Koch, Christoph T.
- US Patent Application 12/549029; 20110049363
X-ray characterization of solid small molecule organic materials
patent-application, May 2011
- Billinge, Simon; Shankland, Kenneth; Shankland, Norman
- US Patent Application 12/802064; 20110106455
Works referencing / citing this record:
Apparatus and method of applying small-angle electron scattering to characterize nanostructures on opaque substrate
patent, July 2016
- Wu, Wen-Li; Chien, Yun-San; Fu, Wei-En
- US Patent Document 9,390,888