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Title: Method of collecting and processing electron diffraction data

Abstract

A method of using electron diffraction to obtain PDFs from crystalline, nanocrystalline, and amorphous inorganic, organic, and organometallic compound.

Inventors:
; ; ; ;
Issue Date:
Research Org.:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1166756
Patent Number(s):
8921783
Application Number:
14/160,185
Assignee:
The Trustees of Columbia University in the City of New York (New York, NY)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
AC02-98CH10886
Resource Type:
Patent
Resource Relation:
Patent File Date: 2014 Jan 21
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 47 OTHER INSTRUMENTATION

Citation Formats

Billinge, Simon, Farrow, Christopher, Gorelik, Tatiana E, Kanatzidis, Mercouri, and Schmidt, Martin U. Method of collecting and processing electron diffraction data. United States: N. p., 2014. Web.
Billinge, Simon, Farrow, Christopher, Gorelik, Tatiana E, Kanatzidis, Mercouri, & Schmidt, Martin U. Method of collecting and processing electron diffraction data. United States.
Billinge, Simon, Farrow, Christopher, Gorelik, Tatiana E, Kanatzidis, Mercouri, and Schmidt, Martin U. Tue . "Method of collecting and processing electron diffraction data". United States. https://www.osti.gov/servlets/purl/1166756.
@article{osti_1166756,
title = {Method of collecting and processing electron diffraction data},
author = {Billinge, Simon and Farrow, Christopher and Gorelik, Tatiana E and Kanatzidis, Mercouri and Schmidt, Martin U},
abstractNote = {A method of using electron diffraction to obtain PDFs from crystalline, nanocrystalline, and amorphous inorganic, organic, and organometallic compound.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {12}
}

Works referenced in this record:

Method and apparatus for measuring thermal diffusivity by ac joule-heating
patent, January 1992


Electron detectors
patent, May 2003


Observation apparatus and observation method using an electron beam
patent, June 2004


Methods and devices for high throughput crystal structure analysis by electron diffraction
patent, August 2012


Pigmented cosmetic compositions
patent-application, July 2003


Chemical prefiltering for phase differentiation via simultaneous energy dispersive spectrometry and electron backscatter diffraction
patent-application, January 2004


Electron beam applying apparatus and drawing apparatus
patent-application, April 2007


Analysis and Screening of Solid Forms Using the Atomic Pair Distribution Function
patent-application, October 2007


Beam Apparatus
patent-application, June 2008


Methods and Apparatus for Spectroscopic Imaging of Materials in an Array
patent-application, January 2009


Processing Materials with Ion Beams
patent-application, January 2010


Scanning Transmission Electron Microscope Using Gas Amplification
patent-application, May 2010


Method and Device for Measuring Electron Diffraction of a Sample
patent-application, March 2011


X-ray characterization of solid small molecule organic materials
patent-application, May 2011


    Works referencing / citing this record: