System and methods to determine and monitor changes in microstructural properties

Title: System and methods to determine and monitor changes in microstructural properties

A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. An example system includes a number of ultrasonic transducers configured to transmit ultrasonic waves towards a target region on a specimen, a voltage source configured to excite the first and second ultrasonic transducers, and a processor configured to determine one or more properties of the specimen.

Inventors:: Turner, Joseph A

Issue Date:: 2014-11-18

OSTI Identifier:: 1164038

Assignee:: Board of Regents of the University of Nebraska (Lincoln, NE) CHO

Patent Number(s):: 8,887,572

Application Number:: 12/984,291

Contract Number:: FG02-01ER45890

Research Org:: Board of Regents of the University of Nebraska, Lincoln, NE (United States)

Sponsoring Org:: USDOE

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; 42 ENGINEERING; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

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