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Title: System and methods to determine and monitor changes in microstructural properties

Abstract

A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. An example system includes a number of ultrasonic transducers configured to transmit ultrasonic waves towards a target region on a specimen, a voltage source configured to excite the first and second ultrasonic transducers, and a processor configured to determine one or more properties of the specimen.

Inventors:
Issue Date:
Research Org.:
Univ. of Nebraska, Lincoln, NE (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1164038
Patent Number(s):
8887572
Application Number:
12/984,291
Assignee:
Board of Regents of the University of Nebraska (Lincoln, NE)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G - PHYSICS G01 - MEASURING G01L - MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
DOE Contract Number:  
FG02-01ER45890
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 42 ENGINEERING; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

Citation Formats

Turner, Joseph A. System and methods to determine and monitor changes in microstructural properties. United States: N. p., 2014. Web.
Turner, Joseph A. System and methods to determine and monitor changes in microstructural properties. United States.
Turner, Joseph A. Tue . "System and methods to determine and monitor changes in microstructural properties". United States. https://www.osti.gov/servlets/purl/1164038.
@article{osti_1164038,
title = {System and methods to determine and monitor changes in microstructural properties},
author = {Turner, Joseph A},
abstractNote = {A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. An example system includes a number of ultrasonic transducers configured to transmit ultrasonic waves towards a target region on a specimen, a voltage source configured to excite the first and second ultrasonic transducers, and a processor configured to determine one or more properties of the specimen.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {11}
}

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Works referenced in this record:

Diffuse ultrasonic backscatter in a two-dimensional domain
journal, April 2009


Exception Criteria in Vertical Track Deflection and Modulus
conference, June 2009