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Title: Ultrafast transient grating radiation to optical image converter

A high sensitivity transient grating ultrafast radiation to optical image converter is based on a fixed transmission grating adjacent to a semiconductor substrate. X-rays or optical radiation passing through the fixed transmission grating is thereby modulated and produces a small periodic variation of refractive index or transient grating in the semiconductor through carrier induced refractive index shifts. An optical or infrared probe beam tuned just below the semiconductor band gap is reflected off a high reflectivity mirror on the semiconductor so that it double passes therethrough and interacts with the radiation induced phase grating therein. A small portion of the optical beam is diffracted out of the probe beam by the radiation induced transient grating to become the converted signal that is imaged onto a detector.
Inventors:
; ; ;
Issue Date:
OSTI Identifier:
1163194
Assignee:
Lawrence Livermore National Security, LLC (Livermore, CA) LLNL
Patent Number(s):
8,879,137
Application Number:
13/423,498
Contract Number:
AC52-07NA27344
Resource Relation:
Patent File Date: 2012 Mar 19
Research Org:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

Works referenced in this record:

Nonlinear optical and bistable properties of a wafer-fused vertical-cavity device based on InGaAsP
journal, January 1997

Determination of bound-electronic and free-carrier nonlinearities in ZnSe, GaAs, CdTe, and ZnTe
journal, January 1992
  • Said, A. A.; Sheik-Bahae, M.; Hagan, D. J.
  • Journal of the Optical Society of America B, Vol. 9, Issue 3, p. 405-414
  • DOI: 10.1364/JOSAB.9.000405