Multi-step contrast sensitivity gauge
Abstract
An X-ray contrast sensitivity gauge is described herein. The contrast sensitivity gauge comprises a plurality of steps of varying thicknesses. Each step in the gauge includes a plurality of recesses of differing depths, wherein the depths are a function of the thickness of their respective step. An X-ray image of the gauge is analyzed to determine a contrast-to-noise ratio of a detector employed to generate the image.
- Inventors:
- Issue Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1159975
- Patent Number(s):
- 8858076
- Application Number:
- 13/241,569
- Assignee:
- Sandia Corporation (Albuquerque, NM)
- Patent Classifications (CPCs):
-
G - PHYSICS G21 - NUCLEAR PHYSICS G21K - TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2011 Sep 23
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Quintana, Enrico C, Thompson, Kyle R, Moore, David G, Heister, Jack D, Poland, Richard W, Ellegood, John P, Hodges, George K, and Prindville, James E. Multi-step contrast sensitivity gauge. United States: N. p., 2014.
Web.
Quintana, Enrico C, Thompson, Kyle R, Moore, David G, Heister, Jack D, Poland, Richard W, Ellegood, John P, Hodges, George K, & Prindville, James E. Multi-step contrast sensitivity gauge. United States.
Quintana, Enrico C, Thompson, Kyle R, Moore, David G, Heister, Jack D, Poland, Richard W, Ellegood, John P, Hodges, George K, and Prindville, James E. Tue .
"Multi-step contrast sensitivity gauge". United States. https://www.osti.gov/servlets/purl/1159975.
@article{osti_1159975,
title = {Multi-step contrast sensitivity gauge},
author = {Quintana, Enrico C and Thompson, Kyle R and Moore, David G and Heister, Jack D and Poland, Richard W and Ellegood, John P and Hodges, George K and Prindville, James E},
abstractNote = {An X-ray contrast sensitivity gauge is described herein. The contrast sensitivity gauge comprises a plurality of steps of varying thicknesses. Each step in the gauge includes a plurality of recesses of differing depths, wherein the depths are a function of the thickness of their respective step. An X-ray image of the gauge is analyzed to determine a contrast-to-noise ratio of a detector employed to generate the image.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {10}
}
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