X-ray backscatter imaging of nuclear materials

Chapman, Jeffrey Allen; Gunning, John E; Hollenbach, Daniel F; Ott, Larry J; Shedlock, Daniel

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Title: X-ray backscatter imaging of nuclear materials

Abstract

The energy of an X-ray beam and critical depth are selected to detect structural discontinuities in a material having an atomic number Z of 57 or greater. The critical depth is selected by adjusting the geometry of a collimator that blocks backscattered radiation so that backscattered X-ray originating from a depth less than the critical depth is not detected. Structures of Lanthanides and Actinides, including nuclear fuel rod materials, can be inspected for structural discontinuities such as gaps, cracks, and chipping employing the backscattered X-ray.

Inventors:: Chapman, Jeffrey Allen; Gunning, John E; Hollenbach, Daniel F; Ott, Larry J; Shedlock, Daniel

Issue Date:: 2014-09-30

Research Org.:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1159920

Patent Number(s):: 8848871

Application Number:: 13/288,168

Assignee:: UT-Battelle, LLC (Oak Ridge, TN)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/203 - Measuring back scattering

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DOE Contract Number:: ACO5-000R22725

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats


                    Chapman, Jeffrey Allen, Gunning, John E, Hollenbach, Daniel F, Ott, Larry J, and Shedlock, Daniel. X-ray backscatter imaging of nuclear materials.  United States: N. p., 2014. 
        Web.

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                    Chapman, Jeffrey Allen, Gunning, John E, Hollenbach, Daniel F, Ott, Larry J, & Shedlock, Daniel. X-ray backscatter imaging of nuclear materials.  United States.

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                    Chapman, Jeffrey Allen, Gunning, John E, Hollenbach, Daniel F, Ott, Larry J, and Shedlock, Daniel. Tue .  
        "X-ray backscatter imaging of nuclear materials".  United States.  https://www.osti.gov/servlets/purl/1159920.

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@article{osti_1159920,

  title        = {X-ray backscatter imaging of nuclear materials},

  author       = {Chapman, Jeffrey Allen and Gunning, John E and Hollenbach, Daniel F and Ott, Larry J and Shedlock, Daniel},

  abstractNote = {The energy of an X-ray beam and critical depth are selected to detect structural discontinuities in a material having an atomic number Z of 57 or greater. The critical depth is selected by adjusting the geometry of a collimator that blocks backscattered radiation so that backscattered X-ray originating from a depth less than the critical depth is not detected. Structures of Lanthanides and Actinides, including nuclear fuel rod materials, can be inspected for structural discontinuities such as gaps, cracks, and chipping employing the backscattered X-ray.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2014},

  month        = {9}

}

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Similar Records

Title: X-ray backscatter imaging of nuclear materials

Abstract

Citation Formats

X-ray backscatter detection system patent, January 1993

X-ray backscatter imaging system including moving body tracking assembly patent, July 2000

Gated transmission and scatter detection for x-ray imaging patent, November 2000

Fan and pencil beams from a common source for x-ray inspection patent, February 2001

X-ray back scatter imaging system for undercarriage inspection patent, June 2001

High energy X-ray inspection system for detecting nuclear weapons materials patent, February 2002

Drive-through vehicle inspection system patent, October 2002

X-ray compton scattering density measurement at a point within an object patent, May 2003

X-ray imaging system with active detector patent, December 2003

Method for obtaining a picture of the internal structure of an object using x-ray radiation and device for the implementation thereof patent, June 2004

Personnel inspection system with x-ray line source patent, August 2004

X-ray backscatter mobile inspection van patent, August 2006

X-ray detector system having low Z material panel patent, September 2006

Methods and systems for determining the average atomic number and mass of materials patent, October 2007

Radiation scanning units including a movable platform patent, April 2008

Backscatter inspection portal patent, July 2008

X-ray inspection based on scatter detection patent, June 2009

Personnel x-ray inspection system patent, July 2009

Multiple image collection and synthesis for personnel screening patent, September 2010

Security system for screening people patent, November 2010

Scatter attenuation tomography patent, April 2011

Methods and apparatus for the identification of materials using photons scattered from the nuclear “PYGMY resonance” patent, May 2011

Method and apparatus for measuring enrichment of UF6 patent, June 2011

X-ray inspection based on scatter detection patent, June 2012

Radiation threat detection patent, December 2012

High-energy X-ray-spectroscopy-based inspection system and methods to determine the atomic number of materials patent, June 2014

X-ray backscatter detection system
patent, January 1993

X-ray backscatter imaging system including moving body tracking assembly
patent, July 2000

Gated transmission and scatter detection for x-ray imaging
patent, November 2000

Fan and pencil beams from a common source for x-ray inspection
patent, February 2001

X-ray back scatter imaging system for undercarriage inspection
patent, June 2001

High energy X-ray inspection system for detecting nuclear weapons materials
patent, February 2002

Drive-through vehicle inspection system
patent, October 2002

X-ray compton scattering density measurement at a point within an object
patent, May 2003

X-ray imaging system with active detector
patent, December 2003

Method for obtaining a picture of the internal structure of an object using x-ray radiation and device for the implementation thereof
patent, June 2004

Personnel inspection system with x-ray line source
patent, August 2004

X-ray backscatter mobile inspection van
patent, August 2006

X-ray detector system having low Z material panel
patent, September 2006

Methods and systems for determining the average atomic number and mass of materials
patent, October 2007

Radiation scanning units including a movable platform
patent, April 2008

Backscatter inspection portal
patent, July 2008

X-ray inspection based on scatter detection
patent, June 2009

Personnel x-ray inspection system
patent, July 2009

Multiple image collection and synthesis for personnel screening
patent, September 2010

Security system for screening people
patent, November 2010

Scatter attenuation tomography
patent, April 2011

Methods and apparatus for the identification of materials using photons scattered from the nuclear “PYGMY resonance”
patent, May 2011

Method and apparatus for measuring enrichment of UF6
patent, June 2011

X-ray inspection based on scatter detection
patent, June 2012

Radiation threat detection
patent, December 2012

High-energy X-ray-spectroscopy-based inspection system and methods to determine the atomic number of materials
patent, June 2014