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Title: Spatially resolved imaging of opto-electrical property variations

Abstract

Systems and methods for opto electric properties are provided. A light source illuminates a sample. A reference detector senses light from the light source. A sample detector receives light from the sample. A positioning fixture allows for relative positioning of the sample or the light source with respect to each other. An electrical signal device measures the electrical properties of the sample. The reference detector, sample detector and electrical signal device provide information that may be processed to determine opto-electric properties of the same.

Inventors:
; ; ; ;
Issue Date:
Research Org.:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1159516
Patent Number(s):
8836944
Application Number:
13/629,320
Assignee:
Uchicago Argonne, LLC (Chicago, IL)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
H - ELECTRICITY H02 - GENERATION H02S - GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-RED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Nikiforov, Maxim, Darling, Seth B, Suzer, Ozgun, Guest, Jeffrey, and Roelofs, Andreas. Spatially resolved imaging of opto-electrical property variations. United States: N. p., 2014. Web.
Nikiforov, Maxim, Darling, Seth B, Suzer, Ozgun, Guest, Jeffrey, & Roelofs, Andreas. Spatially resolved imaging of opto-electrical property variations. United States.
Nikiforov, Maxim, Darling, Seth B, Suzer, Ozgun, Guest, Jeffrey, and Roelofs, Andreas. Tue . "Spatially resolved imaging of opto-electrical property variations". United States. https://www.osti.gov/servlets/purl/1159516.
@article{osti_1159516,
title = {Spatially resolved imaging of opto-electrical property variations},
author = {Nikiforov, Maxim and Darling, Seth B and Suzer, Ozgun and Guest, Jeffrey and Roelofs, Andreas},
abstractNote = {Systems and methods for opto electric properties are provided. A light source illuminates a sample. A reference detector senses light from the light source. A sample detector receives light from the sample. A positioning fixture allows for relative positioning of the sample or the light source with respect to each other. An electrical signal device measures the electrical properties of the sample. The reference detector, sample detector and electrical signal device provide information that may be processed to determine opto-electric properties of the same.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Sep 16 00:00:00 EDT 2014},
month = {Tue Sep 16 00:00:00 EDT 2014}
}

Works referenced in this record:

Optical scanning tomography for three-dimensional dosimetry and imaging of energy fields
patent, April 2001


Light source power modulation for use with chemical and biochemical analysis
patent, March 2002


Fast laser scanning optical CT apparatus
patent, December 2009


Apparatus and method for illuminator-independent color measurements
patent, December 2010


Sample element qualification
patent-application, February 2005


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patent-application, July 2007