Spatially resolved imaging of opto-electrical property variations
Abstract
Systems and methods for opto electric properties are provided. A light source illuminates a sample. A reference detector senses light from the light source. A sample detector receives light from the sample. A positioning fixture allows for relative positioning of the sample or the light source with respect to each other. An electrical signal device measures the electrical properties of the sample. The reference detector, sample detector and electrical signal device provide information that may be processed to determine opto-electric properties of the same.
- Inventors:
- Issue Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1159516
- Patent Number(s):
- 8836944
- Application Number:
- 13/629,320
- Assignee:
- Uchicago Argonne, LLC (Chicago, IL)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
H - ELECTRICITY H02 - GENERATION H02S - GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-RED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- DOE Contract Number:
- AC02-06CH11357
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Nikiforov, Maxim, Darling, Seth B, Suzer, Ozgun, Guest, Jeffrey, and Roelofs, Andreas. Spatially resolved imaging of opto-electrical property variations. United States: N. p., 2014.
Web.
Nikiforov, Maxim, Darling, Seth B, Suzer, Ozgun, Guest, Jeffrey, & Roelofs, Andreas. Spatially resolved imaging of opto-electrical property variations. United States.
Nikiforov, Maxim, Darling, Seth B, Suzer, Ozgun, Guest, Jeffrey, and Roelofs, Andreas. Tue .
"Spatially resolved imaging of opto-electrical property variations". United States. https://www.osti.gov/servlets/purl/1159516.
@article{osti_1159516,
title = {Spatially resolved imaging of opto-electrical property variations},
author = {Nikiforov, Maxim and Darling, Seth B and Suzer, Ozgun and Guest, Jeffrey and Roelofs, Andreas},
abstractNote = {Systems and methods for opto electric properties are provided. A light source illuminates a sample. A reference detector senses light from the light source. A sample detector receives light from the sample. A positioning fixture allows for relative positioning of the sample or the light source with respect to each other. An electrical signal device measures the electrical properties of the sample. The reference detector, sample detector and electrical signal device provide information that may be processed to determine opto-electric properties of the same.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {9}
}
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