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Title: Spatially resolved imaging of opto-electrical property variations

Abstract

Systems and methods for opto electric properties are provided. A light source illuminates a sample. A reference detector senses light from the light source. A sample detector receives light from the sample. A positioning fixture allows for relative positioning of the sample or the light source with respect to each other. An electrical signal device measures the electrical properties of the sample. The reference detector, sample detector and electrical signal device provide information that may be processed to determine opto-electric properties of the same.

Inventors:
; ; ; ;
Issue Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1159516
Patent Number(s):
8,836,944
Application Number:
13/629,320
Assignee:
Uchicago Argonne, LLC (Chicago, IL)
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Nikiforov, Maxim, Darling, Seth B, Suzer, Ozgun, Guest, Jeffrey, and Roelofs, Andreas. Spatially resolved imaging of opto-electrical property variations. United States: N. p., 2014. Web.
Nikiforov, Maxim, Darling, Seth B, Suzer, Ozgun, Guest, Jeffrey, & Roelofs, Andreas. Spatially resolved imaging of opto-electrical property variations. United States.
Nikiforov, Maxim, Darling, Seth B, Suzer, Ozgun, Guest, Jeffrey, and Roelofs, Andreas. Tue . "Spatially resolved imaging of opto-electrical property variations". United States. https://www.osti.gov/servlets/purl/1159516.
@article{osti_1159516,
title = {Spatially resolved imaging of opto-electrical property variations},
author = {Nikiforov, Maxim and Darling, Seth B and Suzer, Ozgun and Guest, Jeffrey and Roelofs, Andreas},
abstractNote = {Systems and methods for opto electric properties are provided. A light source illuminates a sample. A reference detector senses light from the light source. A sample detector receives light from the sample. A positioning fixture allows for relative positioning of the sample or the light source with respect to each other. An electrical signal device measures the electrical properties of the sample. The reference detector, sample detector and electrical signal device provide information that may be processed to determine opto-electric properties of the same.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {9}
}

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