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Title: Rapid screening buffer layers in photovoltaics

An apparatus and method of testing electrical impedance of a multiplicity of regions of a photovoltaic surface includes providing a multi-tipped impedance sensor with a multiplicity of spaced apart impedance probes separated by an insulating material, wherein each impedance probe includes a first end adapted for contact with a photovoltaic surface and a second end in operable communication with an impedance measuring device. The multi-tipped impedance sensor is used to contact the photovoltaic surface and electrical impedance of the photovoltaic material is measured between individual first ends of the probes to characterize the quality of the photovoltaic surface.
Inventors:
;
Issue Date:
OSTI Identifier:
1157072
Assignee:
UT-Battelle, LLC (Oak Ridge, TN) ORO
Patent Number(s):
8,829,930
Application Number:
13/019,024
Contract Number:
AC05-00OR22725
Research Org:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Other works cited in this record:

Apparatus and method for near-field imaging of tissue
patent-application, December 2004

Mass-Productions of Vertically Aligned Extremely Long Metallic Micro/Nanowires Using Fiber Drawing Nanomanufacturing
journal, April 2008
  • Zhang, Xuejun; Ma, Zeyu; Yuan, Zhong-Yong
  • Advanced Materials, Vol. 20, Issue 7, p. 1310-1314
  • DOI: 10.1002/adma.200702126

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