Rapid screening buffer layers in photovoltaics
Abstract
An apparatus and method of testing electrical impedance of a multiplicity of regions of a photovoltaic surface includes providing a multi-tipped impedance sensor with a multiplicity of spaced apart impedance probes separated by an insulating material, wherein each impedance probe includes a first end adapted for contact with a photovoltaic surface and a second end in operable communication with an impedance measuring device. The multi-tipped impedance sensor is used to contact the photovoltaic surface and electrical impedance of the photovoltaic material is measured between individual first ends of the probes to characterize the quality of the photovoltaic surface.
- Inventors:
- Issue Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1157072
- Patent Number(s):
- 8829930
- Application Number:
- 13/019,024
- Assignee:
- UT-Battelle, LLC (Oak Ridge, TN)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
- DOE Contract Number:
- AC05-00OR22725
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
List, III, Frederick Alyious, and Tuncer, Enis. Rapid screening buffer layers in photovoltaics. United States: N. p., 2014.
Web.
List, III, Frederick Alyious, & Tuncer, Enis. Rapid screening buffer layers in photovoltaics. United States.
List, III, Frederick Alyious, and Tuncer, Enis. Tue .
"Rapid screening buffer layers in photovoltaics". United States. https://www.osti.gov/servlets/purl/1157072.
@article{osti_1157072,
title = {Rapid screening buffer layers in photovoltaics},
author = {List, III, Frederick Alyious and Tuncer, Enis},
abstractNote = {An apparatus and method of testing electrical impedance of a multiplicity of regions of a photovoltaic surface includes providing a multi-tipped impedance sensor with a multiplicity of spaced apart impedance probes separated by an insulating material, wherein each impedance probe includes a first end adapted for contact with a photovoltaic surface and a second end in operable communication with an impedance measuring device. The multi-tipped impedance sensor is used to contact the photovoltaic surface and electrical impedance of the photovoltaic material is measured between individual first ends of the probes to characterize the quality of the photovoltaic surface.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {9}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Circuit for Measuring Sheet Resistivity Including an A>C> Current Source and Average Reading D.C. Voltmeter Switch-Ably Connected to Pairs of a Four Probe Array
patent, July 1969
- Bush, Harry D.; Fassett, John R.
- US Patent Document 3456186
Method and Apparatus for Detecting Narrow Streaks and the Average Value of a Property Over a Relatively Wide Region Utilizing a Single Probe
patent, February 1970
- Biddle, Donald E.
- US Patent Document 3497802
Collinear four-point probe head and mount for resistivity measurements
patent, May 1983
- Shiell, Thomas J.
- US Patent Document 4,383,217
Impedance sensing of flaws in non-homogenous materials
patent, February 1997
- Novak, James L.
- US Patent Document 5,602,486
Multi-probe impedance measurement system and method for detection of flaws in conductive articles
patent, April 2001
- Ludwig, Reinhold; McNeill, John; Stander, Jennifer A.
- US Patent Document 6,218,846
Multi-element connector
patent, May 2006
- Swift, Joseph A.; Wallace, Stanley J.
- US Patent Document 7,052,763
Solar cell module and method of producing the same
patent-application, September 2001
- Nakagawa, Katsumi; Nishida, Shoji; Iwasaki, Yukiko
- US Patent Application 09/790589; 20010023702
Apparatus and method for near-field imaging of tissue
patent-application, December 2004
- van der Weide, Daniel Warren
- US Patent Application 10/855686; 20040254457
Silicon Thin Film Solar Cell Having Improved Underlayer Coating
patent-application, June 2011
- Lu, Songwei
- US Patent Application 12/643448; 20110146768
Mass-Productions of Vertically Aligned Extremely Long Metallic Micro/Nanowires Using Fiber Drawing Nanomanufacturing
journal, April 2008
- Zhang, Xuejun; Ma, Zeyu; Yuan, Zhong-Yong
- Advanced Materials, Vol. 20, Issue 7, p. 1310-1314