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Title: Rapid screening buffer layers in photovoltaics

Abstract

An apparatus and method of testing electrical impedance of a multiplicity of regions of a photovoltaic surface includes providing a multi-tipped impedance sensor with a multiplicity of spaced apart impedance probes separated by an insulating material, wherein each impedance probe includes a first end adapted for contact with a photovoltaic surface and a second end in operable communication with an impedance measuring device. The multi-tipped impedance sensor is used to contact the photovoltaic surface and electrical impedance of the photovoltaic material is measured between individual first ends of the probes to characterize the quality of the photovoltaic surface.

Inventors:
;
Issue Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1157072
Patent Number(s):
8,829,930
Application Number:
13/019,024
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

List, III, Frederick Alyious, and Tuncer, Enis. Rapid screening buffer layers in photovoltaics. United States: N. p., 2014. Web.
List, III, Frederick Alyious, & Tuncer, Enis. Rapid screening buffer layers in photovoltaics. United States.
List, III, Frederick Alyious, and Tuncer, Enis. Tue . "Rapid screening buffer layers in photovoltaics". United States. https://www.osti.gov/servlets/purl/1157072.
@article{osti_1157072,
title = {Rapid screening buffer layers in photovoltaics},
author = {List, III, Frederick Alyious and Tuncer, Enis},
abstractNote = {An apparatus and method of testing electrical impedance of a multiplicity of regions of a photovoltaic surface includes providing a multi-tipped impedance sensor with a multiplicity of spaced apart impedance probes separated by an insulating material, wherein each impedance probe includes a first end adapted for contact with a photovoltaic surface and a second end in operable communication with an impedance measuring device. The multi-tipped impedance sensor is used to contact the photovoltaic surface and electrical impedance of the photovoltaic material is measured between individual first ends of the probes to characterize the quality of the photovoltaic surface.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {9}
}

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