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Title: Microfabricated high-bandpass foucault aperture for electron microscopy

Abstract

A variant of the Foucault (knife-edge) aperture is disclosed that is designed to provide single-sideband (SSB) contrast at low spatial frequencies but retain conventional double-sideband (DSB) contrast at high spatial frequencies in transmission electron microscopy. The aperture includes a plate with an inner open area, a support extending from the plate at an edge of the open area, a half-circle feature mounted on the support and located at the center of the aperture open area. The radius of the half-circle portion of reciprocal space that is blocked by the aperture can be varied to suit the needs of electron microscopy investigation. The aperture is fabricated from conductive material which is preferably non-oxidizing, such as gold, for example.

Inventors:
; ;
Issue Date:
Research Org.:
LBNL (Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States))
Sponsoring Org.:
USDOE
OSTI Identifier:
1150829
Patent Number(s):
8,816,297
Application Number:
13/708,521
Assignee:
The Regents of the University of California (Oakland, CA) LBNL
DOE Contract Number:  
A02-05CH11231
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Glaeser, Robert, Cambie, Rossana, and Jin, Jian. Microfabricated high-bandpass foucault aperture for electron microscopy. United States: N. p., 2014. Web.
Glaeser, Robert, Cambie, Rossana, & Jin, Jian. Microfabricated high-bandpass foucault aperture for electron microscopy. United States.
Glaeser, Robert, Cambie, Rossana, and Jin, Jian. Tue . "Microfabricated high-bandpass foucault aperture for electron microscopy". United States. https://www.osti.gov/servlets/purl/1150829.
@article{osti_1150829,
title = {Microfabricated high-bandpass foucault aperture for electron microscopy},
author = {Glaeser, Robert and Cambie, Rossana and Jin, Jian},
abstractNote = {A variant of the Foucault (knife-edge) aperture is disclosed that is designed to provide single-sideband (SSB) contrast at low spatial frequencies but retain conventional double-sideband (DSB) contrast at high spatial frequencies in transmission electron microscopy. The aperture includes a plate with an inner open area, a support extending from the plate at an edge of the open area, a half-circle feature mounted on the support and located at the center of the aperture open area. The radius of the half-circle portion of reciprocal space that is blocked by the aperture can be varied to suit the needs of electron microscopy investigation. The aperture is fabricated from conductive material which is preferably non-oxidizing, such as gold, for example.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {8}
}

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Works referenced in this record:

Minimizing electrostatic charging of an aperture used to produce in-focus phase contrast in the TEM
journal, December 2013