Optical contact micrometer
Abstract
Certain examples provide optical contact micrometers and methods of use. An example optical contact micrometer includes a pair of opposable lenses to receive an object and immobilize the object in a position. The example optical contact micrometer includes a pair of opposable mirrors positioned with respect to the pair of lenses to facilitate viewing of the object through the lenses. The example optical contact micrometer includes a microscope to facilitate viewing of the object through the lenses via the mirrors; and an interferometer to obtain one or more measurements of the object.
- Inventors:
- Issue Date:
- Research Org.:
- Northwestern Univ., Evanston, IL (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1150635
- Patent Number(s):
- 8810904
- Application Number:
- 13/369,851
- Assignee:
- Northwestern University (Evanston, IL)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
G - PHYSICS G01 - MEASURING G01H - MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
- DOE Contract Number:
- FC52-08NA28554
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Jacobson, Steven D. Optical contact micrometer. United States: N. p., 2014.
Web.
Jacobson, Steven D. Optical contact micrometer. United States.
Jacobson, Steven D. Tue .
"Optical contact micrometer". United States. https://www.osti.gov/servlets/purl/1150635.
@article{osti_1150635,
title = {Optical contact micrometer},
author = {Jacobson, Steven D.},
abstractNote = {Certain examples provide optical contact micrometers and methods of use. An example optical contact micrometer includes a pair of opposable lenses to receive an object and immobilize the object in a position. The example optical contact micrometer includes a pair of opposable mirrors positioned with respect to the pair of lenses to facilitate viewing of the object through the lenses. The example optical contact micrometer includes a microscope to facilitate viewing of the object through the lenses via the mirrors; and an interferometer to obtain one or more measurements of the object.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {8}
}
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Works referenced in this record:
Optical inspection and alignment verification system
patent, August 1985
- Kronfeld, Leonard E.
- US Patent Document 4,537,509
Three-dimensional shape measuring apparatus
patent, August 2000
- Ishihara, Mitsuhiro
- US Patent Document 6,108,090
Low-coherence interferometric device for depth scanning an object
patent, November 2005
- Knüttel, Alexander
- US Patent Document 6,970,252
Arrangement for measuring the geometry or structure of an object
patent, June 2007
- Christoph, Ralf
- US Patent Document 7,230,721
Optical displacement measuring apparatus
patent, May 2010
- Iwamoto, Tadashi
- US Patent Document 7,715,025
Interference measuring device
patent, August 2012
- Yamauchi, Toyohiko; Iwai, Hidenao
- US Patent Document 8,248,593