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Title: Micro/nano-mechanical test system employing tensile test holder with push-to-pull transformer

Abstract

A micromachined or microelectromechanical system (MEMS) based push-to-pull mechanical transformer for tensile testing of micro-to-nanometer scale material samples including a first structure and a second structure. The second structure is coupled to the first structure by at least one flexible element that enables the second structure to be moveable relative to the first structure, wherein the second structure is disposed relative to the first structure so as to form a pulling gap between the first and second structures such that when an external pushing force is applied to and pushes the second structure in a tensile extension direction a width of the pulling gap increases so as to apply a tensile force to a test sample mounted across the pulling gap between a first sample mounting area on the first structure and a second sample mounting area on the second structure.

Inventors:
; ; ;
Issue Date:
Research Org.:
Hysitron Incorporated, Eden Prairie, MN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1149934
Patent Number(s):
8789425
Application Number:
13/888,959
Assignee:
Hysitron, Inc. (Eden Prairie, MN)
Patent Classifications (CPCs):
B - PERFORMING OPERATIONS B81 - MICROSTRUCTURAL TECHNOLOGY B81C - PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
G - PHYSICS G01 - MEASURING G01L - MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
DOE Contract Number:  
FG02-07ER84813
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING

Citation Formats

Oh, Yunje, Cyrankowski, Edward, Shan, Zhiwei, and Syed Asif, Syed Amanula. Micro/nano-mechanical test system employing tensile test holder with push-to-pull transformer. United States: N. p., 2014. Web.
Oh, Yunje, Cyrankowski, Edward, Shan, Zhiwei, & Syed Asif, Syed Amanula. Micro/nano-mechanical test system employing tensile test holder with push-to-pull transformer. United States.
Oh, Yunje, Cyrankowski, Edward, Shan, Zhiwei, and Syed Asif, Syed Amanula. Tue . "Micro/nano-mechanical test system employing tensile test holder with push-to-pull transformer". United States. https://www.osti.gov/servlets/purl/1149934.
@article{osti_1149934,
title = {Micro/nano-mechanical test system employing tensile test holder with push-to-pull transformer},
author = {Oh, Yunje and Cyrankowski, Edward and Shan, Zhiwei and Syed Asif, Syed Amanula},
abstractNote = {A micromachined or microelectromechanical system (MEMS) based push-to-pull mechanical transformer for tensile testing of micro-to-nanometer scale material samples including a first structure and a second structure. The second structure is coupled to the first structure by at least one flexible element that enables the second structure to be moveable relative to the first structure, wherein the second structure is disposed relative to the first structure so as to form a pulling gap between the first and second structures such that when an external pushing force is applied to and pushes the second structure in a tensile extension direction a width of the pulling gap increases so as to apply a tensile force to a test sample mounted across the pulling gap between a first sample mounting area on the first structure and a second sample mounting area on the second structure.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {7}
}

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