Nanomechanical testing system

Vodnick, David James; Dwivedi, Arpit; Keranen, Lucas Paul; Okerlund, Michael David; Schmitz, Roger William; Warren, Oden Lee; Young, Christopher David

Advanced Search OptionsAdvanced Search queries use a traditional Term Search. For more info, see our FAQ.

All Fields:

Patent Title:

Abstract:

Assignee:

Inventor(s):

Patent Number:

Patent Classification (CPC):

All Classifications
A - human necessities
A01 - agriculture
A21 - baking
A22 - butchering
A23 - foods or foodstuffs
A24 - tobacco
A41 - wearing apparel
A42 - headwear
A43 - footwear
A44 - haberdashery
A45 - hand or travelling articles
A46 - brushware
A47 - furniture
A61 - medical or veterinary science
A62 - life-saving
A63 - sports
A99 - subject matter not otherwise provided for in this section
B - performing operations
B01 - physical or chemical processes or apparatus in general
B02 - crushing, pulverising, or disintegrating
B03 - separation of solid materials using liquids or using pneumatic tables or jigs
B04 - centrifugal apparatus or machines for carrying-out physical or chemical processes
B05 - spraying or atomising in general
B06 - generating or transmitting mechanical vibrations in general
B07 - separating solids from solids
B08 - cleaning
B09 - disposal of solid waste
B21 - mechanical metal-working without essentially removing material
B22 - casting
B23 - machine tools
B24 - grinding
B25 - hand tools
B26 - hand cutting tools
B27 - working or preserving wood or similar material
B28 - working cement, clay, or stone
B29 - working of plastics
B30 - presses
B31 - making articles of paper, cardboard or material worked in a manner analogous to paper
B32 - layered products
B33 - additive manufacturing technology
B41 - printing
B42 - bookbinding
B43 - writing or drawing implements
B44 - decorative arts
B60 - vehicles in general
B61 - railways
B62 - land vehicles for travelling otherwise than on rails
B63 - ships or other waterborne vessels
B64 - aircraft
B65 - conveying
B66 - hoisting
B67 - opening, closing {or cleaning} bottles, jars or similar containers
B68 - saddlery
B81 - microstructural technology
B82 - nanotechnology
B99 - subject matter not otherwise provided for in this section
C - chemistry
C01 - inorganic chemistry
C02 - treatment of water, waste water, sewage, or sludge
C03 - glass
C04 - cements
C05 - fertilisers
C06 - explosives
C07 - organic chemistry
C08 - organic macromolecular compounds
C09 - dyes
C10 - petroleum, gas or coke industries
C11 - animal or vegetable oils, fats, fatty substances or waxes
C12 - biochemistry
C13 - sugar industry
C14 - skins
C21 - metallurgy of iron
C22 - metallurgy
C23 - coating metallic material
C25 - electrolytic or electrophoretic processes
C30 - crystal growth
C40 - combinatorial technology
C99 - subject matter not otherwise provided for in this section
D - textiles
D01 - natural or man-made threads or fibres
D02 - yarns
D03 - weaving
D04 - braiding
D05 - sewing
D06 - treatment of textiles or the like
D07 - ropes
D10 - indexing scheme associated with sublasses of section d, relating to textiles
D21 - paper-making
D99 - subject matter not otherwise provided for in this section
E - fixed constructions
E01 - construction of roads, railways, or bridges
E02 - hydraulic engineering
E03 - water supply
E04 - building
E05 - locks
E06 - doors, windows, shutters, or roller blinds in general
E21 - earth drilling
E99 - subject matter not otherwise provided for in this section
F - mechanical engineering
F01 - machines or engines in general
F02 - combustion engines
F03 - machines or engines for liquids
F04 - positive - displacement machines for liquids
F05 - indexing schemes relating to engines or pumps in various subclasses of classes f01-f04
F15 - fluid-pressure actuators
F16 - engineering elements and units
F17 - storing or distributing gases or liquids
F21 - lighting
F22 - steam generation
F23 - combustion apparatus
F24 - heating
F25 - refrigeration or cooling
F26 - drying
F27 - furnaces
F28 - heat exchange in general
F41 - weapons
F42 - ammunition
F99 - subject matter not otherwise provided for in this section
G - physics
G01 - measuring
G02 - optics
G03 - photography
G04 - horology
G05 - controlling
G06 - computing
G07 - checking-devices
G08 - signalling
G09 - education
G10 - musical instruments
G11 - information storage
G12 - instrument details
G16 - information and communication technology [ict] specially adapted for specific application fields
G21 - nuclear physics
G99 - subject matter not otherwise provided for in this section
H - electricity
H01 - basic electric elements
H02 - generation
H03 - basic electronic circuitry
H04 - electric communication technique
H05 - electric techniques not otherwise provided for
H99 - subject matter not otherwise provided for in this section
Y - new / cross sectional technologies
Y02 - technologies or applications for mitigation or adaptation against climate change
Y04 - information or communication technologies having an impact on other technology areas
Y10 - technical subjects covered by former uspc

More Options ...

Title: Nanomechanical testing system

Abstract

An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.

Inventors:: Vodnick, David James; Dwivedi, Arpit; Keranen, Lucas Paul; Okerlund, Michael David; Schmitz, Roger William; Warren, Oden Lee; Young, Christopher David

Issue Date:: 2014-07-08

Research Org.:: Hysitron, Inc., Eden Prairie, MN (USA)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1143650

Patent Number(s):: 8770036

Application Number:: 13/962,865

Assignee:: Hysitron, Inc. (Eden Prairie, MN)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Show more

G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
G01B11/27 - for testing the alignment of axes {
G01B21/047 - {Accessories, e.g. for positioning, for tool-setting, for measuring probes}

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N19/00 - Investigating materials by mechanical methods
G01N2203/0082 - Indentation characteristics measured during load
G01N2203/0286 - Miniature specimen
G01N3/02 - Details
G01N3/42 - by performing impressions under a steady load by indentors, e.g. sphere, pyramid

G - PHYSICS G01 - MEASURING G01P - MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK
G01P21/00 - Testing or calibrating of apparatus or devices covered by the preceding groups

G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
G01Q40/00 - Calibration, e.g. of probes
G01Q60/366 - {Nanoindenters, i.e. wherein the indenting force is measured}

Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10T - TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
Y10T29/49826 - Assembling or joining

Show less

DOE Contract Number:: SC0002722

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: 77 NANOSCIENCE AND NANOTECHNOLOGY

Citation Formats


                    Vodnick, David James, Dwivedi, Arpit, Keranen, Lucas Paul, Okerlund, Michael David, Schmitz, Roger William, Warren, Oden Lee, and Young, Christopher David. Nanomechanical testing system.  United States: N. p., 2014. 
        Web.

Copy to clipboard


                    Vodnick, David James, Dwivedi, Arpit, Keranen, Lucas Paul, Okerlund, Michael David, Schmitz, Roger William, Warren, Oden Lee, & Young, Christopher David. Nanomechanical testing system.  United States.

Copy to clipboard


                    Vodnick, David James, Dwivedi, Arpit, Keranen, Lucas Paul, Okerlund, Michael David, Schmitz, Roger William, Warren, Oden Lee, and Young, Christopher David. Tue .  
        "Nanomechanical testing system".  United States.  https://www.osti.gov/servlets/purl/1143650.

Copy to clipboard


                    
@article{osti_1143650,

  title        = {Nanomechanical testing system},

  author       = {Vodnick, David James and Dwivedi, Arpit and Keranen, Lucas Paul and Okerlund, Michael David and Schmitz, Roger William and Warren, Oden Lee and Young, Christopher David},

  abstractNote = {An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2014},

  month        = {7}

}

Copy to clipboard

Patent:

Works referenced in this record:

Fastener placing apparatus
patent, February 1978

Summerlin, Frederick A.
US Patent Document 4,074,554
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/4074554

Method and apparatus for testing the operability of a probe
patent, September 1987

Juengel, Richard O.
US Patent Document 4,693,110
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/4693110

Method and apparatus for separating fixture-induced error from measured object characteristics and for compensating the measured object characteristic with the error, and a bow/warp station implementing same
patent, June 1988

Judell, Neil; Poduje, Noel S.
US Patent Document 4,750,141
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/4750141

Wafer prober
patent, September 1989

Sato, Mitsuya
US Patent Document 4,864,227
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/4864227

Cops preparation station
patent, October 1991

Schreiber, Manfred
US Patent Document 5,058,816
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5058816

Load-lock unit and wafer transfer system
patent, August 1994

Oosawa, Tetsu; Asakawa, Teruo; Nebuka, Kenji
US Patent Document 5,340,261
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5340261

Wafer testing and self-calibration system
patent, June 1997

Mallory, Roy E.; Domenicali, Peter; Poduje, Noel S.
US Patent Document 5,642,298
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5642298

Multi-direction optical data port
patent, March 1998

Sevier, Richard G.; Andersen, Eric L.
US Patent Document 5,729,394
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5729394

Wafer prober having sub-micron alignment accuracy
patent, June 1998

Markowski, Paul S.; Cosby, Theodore J.
US Patent Document 5,773,951
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5773951

Optical coordinate measuring machines and optical touch probes
patent, October 1998

Freifeld, Daniel
US Patent Document 5,825,666
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5825666

Measurement probe system with EOS/ESD protection
patent, May 2004

Yang, Kei-Wean C.
US Patent Document 6,731,104
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6731104

System and method for finding the center of rotation of an R-theta stage
patent, June 2004

Chizhov, Ilya; Ebert, Martin
US Patent Document 6,747,746
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6747746

Differential measurement probe having retractable double cushioned variable spacing probing tips with EOS/ESD protection capabilities
patent, January 2007

Yang, Kei-Wean C.
US Patent Document 7,167,011
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7167011

Combined test instrument probe and voltage detector
patent, July 2007

Cavoretto, James L.
US Patent Document 7,242,173
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7242173

Manipulator for rotating and translating a sample holder
patent, February 2011

van de Water, Jeroen; van den Oetelaar, Johannes Antonius Maria; Wagner, Raymond
US Patent Document 7,884,326
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7884326

Power ratchet wrench
patent-application, December 2002

Ono, Akira; Yumoto, Akio
US Patent Application 10/164195; 20020184975
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20020184975

Ratchet wrench
patent-application, September 2005

Liu, Kuo-Chen
US Patent Application 10/804049; 20050204868
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20050204868

Torque-limited electrical connector
patent-application, March 2006

Lau, Michael Robert; De Wild, Eric Michel
US Patent Application 10/925441; 20060043809
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20060043809

Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them
patent-application, June 2006

Arikado, Tsunetoshi; Iwase, Masao; Nadahara, Soichi
US Patent Application 11/350027; 20060131696
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20060131696

Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station
patent-application, September 2006

Kiesewetter, Joerg; Schmidt, Axel; Kreissig, Stefan
US Patent Application 11/365424; 20060212248
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20060212248

Roughness measuring instrument with testing standard
patent-application, March 2007

Tolzer, Jurgen; Willig, Reinhard
US Patent Application 10/565882; 20070068232
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20070068232

Wafer measurement system and apparatus
patent-application, June 2007

Marx, David S.; Grant, David L.; Mahoney, Michael A.
US Patent Application 11/527902; 20070148792
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20070148792

Nanoindenter
patent-application, October 2007

Bonilla, Flavio Alejandro; Proksch, Roger; Cleveland, Jason
US Patent Application 11/724067; 20070227236
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20070227236

Methods and Apparatus for Applying Torque and Rotation to Connections
patent-application, February 2008

Koithan, Thomas; Ruark, Graham; Newman, John W.
US Patent Application 11/930287; 20080047749
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080047749

Apparatus for sample preparation
patent-application, May 2008

Laugham, James R.; Garrison, Brevard S.
US Patent Application 12/006126; 20080105063
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080105063

Tool with end effector force limiter
patent-application, October 2008

Hinman, Cameron D.; Bertsch, Karrie S.
US Patent Application 11/787599; 20080255608
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080255608

Method for Scanning a Surface with the Aid of a Coordinate Measuring Machine and Coordinate Measuring Machine
patent-application, December 2008

Fuchs, Andreas; Burger, Jochen; Deeg, Hermann
US Patent Application 12/189252; 20080307662
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080307662

Methods and instruments for materials testing
patent-application, March 2009

Hansma, Paul; Drake, Barney; Rehn, Douglas
US Patent Application 12/079444; 20090056427
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20090056427

High Temperature Range Electrical Circuit Testing
patent-application, May 2009

Young, Ronald W.; De Ruyck, Frank G. J.
US Patent Application 11/871716; 20090115437
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20090115437

Stress Micro Mechanical Test Cell, Device, System and Methods
patent-application, April 2010

Chasiotis, Ioannis; Naraghi, Mohammad
US Patent Application 12/527776; 20100088788
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20100088788

Nanomechanical characterisation of solid surfaces and thin films
journal, June 2003

Bhushan, Bharat; Li, Xiaodong
International Materials Reviews, Vol. 48, Issue 3
https://doi.org/10.1179/095066003225010227

Works referencing / citing this record:

System for the combined, probe-based mechanical and electrical testing of MEMS
patent, February 2017

Beyeler, Felix; Bolliger, Christoph; Frost, Jr., Daniel A.
US Patent Document 9,575,093
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9575093

Sample distribution in a method for isolating analytes in fluid samples in an automated system
patent, July 2016

Frank, Paul; Gisler, Andreas; Huesler, Robert
US Patent Document 9,383,379
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9383379

Temperature and humidity chamber
patent, July 2015

Matsuguma, Osamu; Watanabe, Yasushi
US Patent Document D734,181
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/D734181