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Title: X-ray characterization of solid small molecule organic materials

Abstract

The present invention provides, inter alia, methods of characterizing a small molecule organic material, e.g., a drug or a drug product. This method includes subjecting the solid small molecule organic material to x-ray total scattering analysis at a short wavelength, collecting data generated thereby, and mathematically transforming the data to provide a refined set of data.

Inventors:
; ; ;
Issue Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1133820
Patent Number(s):
8751168
Application Number:
12/802,064
Assignee:
The Trustees of Columbia University in the City of New York (New York, NY)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
AC02-98CH10886
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Billinge, Simon, Shankland, Kenneth, Shankland, Norman, and Florence, Alastair. X-ray characterization of solid small molecule organic materials. United States: N. p., 2014. Web.
Billinge, Simon, Shankland, Kenneth, Shankland, Norman, & Florence, Alastair. X-ray characterization of solid small molecule organic materials. United States.
Billinge, Simon, Shankland, Kenneth, Shankland, Norman, and Florence, Alastair. Tue . "X-ray characterization of solid small molecule organic materials". United States. https://www.osti.gov/servlets/purl/1133820.
@article{osti_1133820,
title = {X-ray characterization of solid small molecule organic materials},
author = {Billinge, Simon and Shankland, Kenneth and Shankland, Norman and Florence, Alastair},
abstractNote = {The present invention provides, inter alia, methods of characterizing a small molecule organic material, e.g., a drug or a drug product. This method includes subjecting the solid small molecule organic material to x-ray total scattering analysis at a short wavelength, collecting data generated thereby, and mathematically transforming the data to provide a refined set of data.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {6}
}

Patent:

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