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Title: X-ray characterization of solid small molecule organic materials

The present invention provides, inter alia, methods of characterizing a small molecule organic material, e.g., a drug or a drug product. This method includes subjecting the solid small molecule organic material to x-ray total scattering analysis at a short wavelength, collecting data generated thereby, and mathematically transforming the data to provide a refined set of data.
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Issue Date:
OSTI Identifier:
The Trustees of Columbia University in the City of New York (New York, NY) CHO
Patent Number(s):
Application Number:
Contract Number:
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org:
Country of Publication:
United States

Works referenced in this record:

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