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Title: X-ray characterization of solid small molecule organic materials

The present invention provides, inter alia, methods of characterizing a small molecule organic material, e.g., a drug or a drug product. This method includes subjecting the solid small molecule organic material to x-ray total scattering analysis at a short wavelength, collecting data generated thereby, and mathematically transforming the data to provide a refined set of data.
Inventors:
; ; ;
Issue Date:
OSTI Identifier:
1133820
Assignee:
The Trustees of Columbia University in the City of New York (New York, NY) CHO
Patent Number(s):
8,751,168
Application Number:
12/802,064
Contract Number:
AC02-98CH10886
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Works referenced in this record:

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