Two-axis sagittal focusing monochromator

Haas, Edwin G; Stelmach, Christopher; Zhong, Zhong

Title: Two-axis sagittal focusing monochromator

Abstract

An x-ray focusing device and method for adjustably focusing x-rays in two orthogonal directions simultaneously. The device and method can be operated remotely using two pairs of orthogonal benders mounted on a rigid, open frame such that x-rays may pass through the opening in the frame. The added x-ray flux allows significantly higher brightness from the same x-ray source.

Inventors:: Haas, Edwin G; Stelmach, Christopher; Zhong, Zhong

Issue Date:: 2014-05-13

Research Org.:: Brookhaven National Lab. (BNL), Upton, NY (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1130971

Patent Number(s):: 8724776

Application Number:: 13/227,517

Assignee:: Brookhaven Science Associates, LLC (Upton, NY)

Patent Classifications (CPCs):: G - PHYSICS G21 - NUCLEAR PHYSICS G21K - TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR

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G - PHYSICS G21 - NUCLEAR PHYSICS G21K - TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR
G21K2201/064 - having a curved surface
G21K2201/062 - the element being a crystal
G21K1/06 - using diffraction, refraction or reflection, e.g. monochromators

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DOE Contract Number:: AC02-98CH10886

Resource Type:: Patent

Resource Relation:: Patent File Date: 2011 Sep 08

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION

Citation Formats


                    Haas, Edwin G, Stelmach, Christopher, and Zhong, Zhong. Two-axis sagittal focusing monochromator.  United States: N. p., 2014. 
        Web.

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                    Haas, Edwin G, Stelmach, Christopher, & Zhong, Zhong. Two-axis sagittal focusing monochromator.  United States.

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                    Haas, Edwin G, Stelmach, Christopher, and Zhong, Zhong. Tue .  
        "Two-axis sagittal focusing monochromator".  United States.  https://www.osti.gov/servlets/purl/1130971.

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@article{osti_1130971,

  title        = {Two-axis sagittal focusing monochromator},

  author       = {Haas, Edwin G and Stelmach, Christopher and Zhong, Zhong},

  abstractNote = {An x-ray focusing device and method for adjustably focusing x-rays in two orthogonal directions simultaneously. The device and method can be operated remotely using two pairs of orthogonal benders mounted on a rigid, open frame such that x-rays may pass through the opening in the frame. The added x-ray flux allows significantly higher brightness from the same x-ray source.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2014},

  month        = {5}

}

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Works referenced in this record:

X-ray spectrometer having a doubly curved crystal
patent, August 1990

Huizing, Albert; Zegers, Cornelis; Heijmans, Teunis
US Patent Document 4,949,367
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Curved crystal x-ray optical device and method of fabrication
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Wittry, David
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X-ray imaging crystal spectrometer for extended X-ray sources
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Bitter, Manfred; Fraenkel, Ben; Gorman, James
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Sagittal focusing Laue monochromator
patent, March 2009

Zhong, Zhong; Hanson, Jonathan; Hastings, Jerome
US Patent Document 7,508,912
URL: http://patft.uspto.gov/netacgi/nph-Parser?Sect2=PTO1&Sect2=HITOFF&p=1&u=%2Fnetahtml%2FPTO%2Fsearch-bool.html&r=1&f=G&l=50&d=PALL&RefSrch=yes&Query=PN%2F7508912

Sagittal Focusing Laue Monochromator
patent-application, October 2008

Zhong, Zhong; Hanson, Jonathan; Hastings, Jerome
US Patent Application 11/693900; 20080247512
URL: http://appft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PG01&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.html&r=1&f=G&l=50&s1=%2220080247512%22.PGNR.&OS=DN/20080247512&RS=DN/20080247512

Spatially resolved Poisson strain and anticlastic curvature measurements in Si under large deflection bending
journal, June 2003

Yang, Wenge; Larson, B. C.; Ice, G. E.
Applied Physics Letters, Vol. 82, Issue 22
https://doi.org/10.1063/1.1579857

Sagittal focusing of high-energy synchrotron X-rays with asymmetric Laue crystals. II. Experimental studies
journal, September 2001

Zhong, Z.; Kao, C. C.; Siddons, D. P.
Journal of Applied Crystallography, Vol. 34, Issue 5, p. 646-653
https://doi.org/10.1107/S0021889801010627

Sagittal focusing of high-energy synchrotron X-rays with asymmetric Laue crystals. I. Theoretical considerations
journal, July 2001

Zhong, Z.; Kao, C. C.; Siddons, D. P.
Journal of Applied Crystallography, Vol. 34, Issue 4, p. 504-509
https://doi.org/10.1107/S0021889801006409

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Title: Two-axis sagittal focusing monochromator

Abstract

Citation Formats

X-ray spectrometer having a doubly curved crystal patent, August 1990

Curved crystal x-ray optical device and method of fabrication patent, May 2001

X-ray imaging crystal spectrometer for extended X-ray sources patent, July 2001

Sagittal focusing Laue monochromator patent, March 2009

Sagittal Focusing Laue Monochromator patent-application, October 2008

Spatially resolved Poisson strain and anticlastic curvature measurements in Si under large deflection bending journal, June 2003

Sagittal focusing of high-energy synchrotron X-rays with asymmetric Laue crystals. II. Experimental studies journal, September 2001

Sagittal focusing of high-energy synchrotron X-rays with asymmetric Laue crystals. I. Theoretical considerations journal, July 2001

X-ray spectrometer having a doubly curved crystal
patent, August 1990

Curved crystal x-ray optical device and method of fabrication
patent, May 2001

X-ray imaging crystal spectrometer for extended X-ray sources
patent, July 2001

Sagittal focusing Laue monochromator
patent, March 2009

Sagittal Focusing Laue Monochromator
patent-application, October 2008

Spatially resolved Poisson strain and anticlastic curvature measurements in Si under large deflection bending
journal, June 2003

Sagittal focusing of high-energy synchrotron X-rays with asymmetric Laue crystals. II. Experimental studies
journal, September 2001

Sagittal focusing of high-energy synchrotron X-rays with asymmetric Laue crystals. I. Theoretical considerations
journal, July 2001