Lateral displacement and rotational displacement sensor
Abstract
A position measuring sensor formed from opposing sets of capacitor plates measures both rotational displacement and lateral displacement from the changes in capacitances as overlapping areas of capacitors change. Capacitances are measured by a measuring circuit. The measured capacitances are provided to a calculating circuit that performs calculations to obtain angular and lateral displacement from the capacitances measured by the measuring circuit.
- Inventors:
- Issue Date:
- Research Org.:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1129382
- Patent Number(s):
- 8704536
- Application Number:
- 13/002,762
- Assignee:
- The Regents of the University of California (Oakland, CA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
G - PHYSICS G02 - OPTICS G02B - OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
- DOE Contract Number:
- AC02-05CH11231
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2009 Jul 28
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Duden, Thomas. Lateral displacement and rotational displacement sensor. United States: N. p., 2014.
Web.
Duden, Thomas. Lateral displacement and rotational displacement sensor. United States.
Duden, Thomas. Tue .
"Lateral displacement and rotational displacement sensor". United States. https://www.osti.gov/servlets/purl/1129382.
@article{osti_1129382,
title = {Lateral displacement and rotational displacement sensor},
author = {Duden, Thomas},
abstractNote = {A position measuring sensor formed from opposing sets of capacitor plates measures both rotational displacement and lateral displacement from the changes in capacitances as overlapping areas of capacitors change. Capacitances are measured by a measuring circuit. The measured capacitances are provided to a calculating circuit that performs calculations to obtain angular and lateral displacement from the capacitances measured by the measuring circuit.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Apr 22 00:00:00 EDT 2014},
month = {Tue Apr 22 00:00:00 EDT 2014}
}
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