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Title: Sub-microsecond-resolution probe microscopy

Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.
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Issue Date:
OSTI Identifier:
University of Washington through its Center for Commercialization (Seattle, WA) CHO
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Resource Relation:
Patent File Date: 2011 Sep 14
Research Org:
University of Washington, Seattle, WA (United States). Center for Commercialization
Sponsoring Org:
Country of Publication:
United States

Works referenced in this record:

Spatially resolved femtosecond time correlation measurements on a GaAsP photodiode
journal, April 1999

Time-resolved spectroscopy of single molecules using near-field and far-field optics
journal, April 1996

High-speed atomic force microscopy for nano-visualization of dynamic biomolecular processes
journal, November 2008

Charge Photogeneration in Organic Solar Cells
journal, November 2010
  • Clarke, Tracey M.; Durrant, James R.
  • Chemical Reviews, Vol. 110, Issue 11, p. 6736-6767
  • DOI: 10.1021/cr900271s

Mapping Local Photocurrents in Polymer/Fullerene Solar Cells with Photoconductive Atomic Force Microscopy
journal, March 2007
  • Coffey, David C.; Reid, Obadiah G.; Rodovsky, Deanna B.
  • Nano Letters, Vol. 7, Issue 3, p. 738-744
  • DOI: 10.1021/nl062989e

New SPM techniques for analyzing OPV materials
journal, September 2010

Noncontact estimation of intercellular breaking force using a femtosecond laser impulse quantified by atomic force microscopy
journal, January 2011
  • Hosokawa, Yoichiroh; Hagiyama, Man; Iino, Takanori
  • Proceedings of the National Academy of Sciences, Vol. 108, Issue 5, p. 1777-1782
  • DOI: 10.1073/pnas.1006847108

Scanned-probe detection of electron spin resonance from a nitroxide spin probe
journal, December 2009
  • Moore, Eric W.; Lee, SangGap; Hickman, Steven A.
  • Proceedings of the National Academy of Sciences, Vol. 106, Issue 52, p. 22251-22256
  • DOI: 10.1073/pnas.0908120106

Inverting dynamic force microscopy: From signals to time-resolved interaction forces
journal, June 2002
  • Stark, M.; Stark, R. W.; Heckl, W. M.
  • Proceedings of the National Academy of Sciences, Vol. 99, Issue 13, p. 8473-8478
  • DOI: 10.1073/pnas.122040599

Nanoscale Morphology of High-Performance Polymer Solar Cells
journal, April 2005
  • Yang, Xiaoniu; Loos, Joachim; Veenstra, Sjoerd C.
  • Nano Letters, Vol. 5, Issue 4, p. 579-583
  • DOI: 10.1021/nl048120i