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Title: Sub-microsecond-resolution probe microscopy

Abstract

Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.

Inventors:
; ; ; ;
Issue Date:
Research Org.:
University of Washington, Seattle, WA (United States). Center for Commercialization
Sponsoring Org.:
USDOE
OSTI Identifier:
1128706
Patent Number(s):
8686358
Application Number:
13/232,859
Assignee:
University of Washington through its Center for Commercialization (Seattle, WA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
DOE Contract Number:  
SC0001084
Resource Type:
Patent
Resource Relation:
Patent File Date: 2011 Sep 14
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Ginger, David, Giridharagopal, Rajiv, Moore, David, Rayermann, Glennis, and Reid, Obadiah. Sub-microsecond-resolution probe microscopy. United States: N. p., 2014. Web.
Ginger, David, Giridharagopal, Rajiv, Moore, David, Rayermann, Glennis, & Reid, Obadiah. Sub-microsecond-resolution probe microscopy. United States.
Ginger, David, Giridharagopal, Rajiv, Moore, David, Rayermann, Glennis, and Reid, Obadiah. Tue . "Sub-microsecond-resolution probe microscopy". United States. https://www.osti.gov/servlets/purl/1128706.
@article{osti_1128706,
title = {Sub-microsecond-resolution probe microscopy},
author = {Ginger, David and Giridharagopal, Rajiv and Moore, David and Rayermann, Glennis and Reid, Obadiah},
abstractNote = {Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {4}
}

Patent:

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