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Title: Sub-microsecond-resolution probe microscopy

Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.
Inventors:
; ; ; ;
Issue Date:
OSTI Identifier:
1128706
Assignee:
University of Washington through its Center for Commercialization (Seattle, WA) CHO
Patent Number(s):
8,686,358
Application Number:
13/232,859
Contract Number:
SC0001084
Resource Relation:
Patent File Date: 2011 Sep 14
Research Org:
University of Washington, Seattle, WA (United States). Center for Commercialization
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

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