DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Sub-microsecond-resolution probe microscopy

Abstract

Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.

Inventors:
; ; ; ;
Issue Date:
Research Org.:
University of Washington, Seattle, WA (United States). Center for Commercialization
Sponsoring Org.:
USDOE
OSTI Identifier:
1128706
Patent Number(s):
8686358
Application Number:
13/232,859
Assignee:
University of Washington through its Center for Commercialization (Seattle, WA)
Patent Classifications (CPCs):
B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
DOE Contract Number:  
SC0001084
Resource Type:
Patent
Resource Relation:
Patent File Date: 2011 Sep 14
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Ginger, David, Giridharagopal, Rajiv, Moore, David, Rayermann, Glennis, and Reid, Obadiah. Sub-microsecond-resolution probe microscopy. United States: N. p., 2014. Web.
Ginger, David, Giridharagopal, Rajiv, Moore, David, Rayermann, Glennis, & Reid, Obadiah. Sub-microsecond-resolution probe microscopy. United States.
Ginger, David, Giridharagopal, Rajiv, Moore, David, Rayermann, Glennis, and Reid, Obadiah. Tue . "Sub-microsecond-resolution probe microscopy". United States. https://www.osti.gov/servlets/purl/1128706.
@article{osti_1128706,
title = {Sub-microsecond-resolution probe microscopy},
author = {Ginger, David and Giridharagopal, Rajiv and Moore, David and Rayermann, Glennis and Reid, Obadiah},
abstractNote = {Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Apr 01 00:00:00 EDT 2014},
month = {Tue Apr 01 00:00:00 EDT 2014}
}

Works referenced in this record:

Non-contact measurement of electrical waveforms on the surface of a sample using time domain gating
patent, September 1999


Multi-pulse sampling of signals using electrostatic force sampling
patent, October 2000


Methods and apparatuses using proximal probes
patent, December 2008


Probe apparatus for measuring an electron state on a sample surface
patent, February 2009


Atomic force microscopy devices, arrangements and systems
patent, December 2011


Probe Apparatus
patent-application, May 2007


Atomic Force Microscope Using A Torsional Harmonic Cantilever
patent-application, February 2008


Probe Apparatus for Measuring an Electron State on a Sample Surface
patent-application, June 2009


Measurement and Mapping of Molecular Stretching and Rupture Forces
patent-application, July 2010


Atomic Force Microscope Including Accelerometer
patent-application, February 2011


Composition and Methods for Photocontrolled Hybridization and Dehybridization of a Nucleic Acid
patent-application, June 2013


Spatially resolved femtosecond time correlation measurements on a GaAsP photodiode
journal, April 1999


Time-resolved spectroscopy of single molecules using near-field and far-field optics
journal, April 1996


Frequency modulation detection using high‐ Q cantilevers for enhanced force microscope sensitivity
journal, January 1991


High-speed atomic force microscopy for nano-visualization of dynamic biomolecular processes
journal, November 2008


Real Space Mapping of Li-Ion Transport in Amorphous Si Anodes with Nanometer Resolution
journal, September 2010


Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions
journal, February 1997


Estimating and interpreting the instantaneous frequency of a signal. I. Fundamentals
journal, April 1992


Charge Photogeneration in Organic Solar Cells
journal, November 2010


Time-resolved electrostatic force microscopy of polymer solar cells
journal, August 2006


Mapping Local Photocurrents in Polymer/Fullerene Solar Cells with Photoconductive Atomic Force Microscopy
journal, March 2007


Characterizing Morphology in Bulk Heterojunction Organic Photovoltaic Systems
journal, March 2010


New SPM techniques for analyzing OPV materials
journal, September 2010


Imaging of nanoscale charge transport in bulk heterojunction solar cells
journal, June 2011


Ultrafast voltage-contrast scanning probe microscopy
journal, December 1996


Noncontact estimation of intercellular breaking force using a femtosecond laser impulse quantified by atomic force microscopy
journal, January 2011


Time-Resolved Electric Force Microscopy of Charge Trapping in Polycrystalline Pentacene
journal, July 2007


Adaptive control of force microscope cantilever dynamics
journal, September 2007


Radio-frequency scanning tunnelling microscopy
journal, November 2007


Measurement of Fast Electron Spin Relaxation Times with Atomic Resolution
journal, September 2010


Scanning Kelvin Probe Microscopy on Bulk Heterojunction Polymer Blends
journal, May 2009


Real-Time Measurements of Conductance Switching and Motion of Single Oligo(phenylene ethynylene) Molecules
journal, August 2007


Scanned-probe detection of electron spin resonance from a nitroxide spin probe
journal, December 2009


Femtosecond pump-probe near-field optical microscopy
journal, June 1999


Imaging Local Trap Formation in Conjugated Polymer Solar Cells: A Comparison of Time-Resolved Electrostatic Force Microscopy and Scanning Kelvin Probe Imaging
journal, October 2010


Nanostructure determines the intensity-dependence of open-circuit voltage in plastic solar cells
journal, October 2010


Microsecond atomic force sensing of protein conformational dynamics: Implications for the primary light-induced events in bacteriorhodopsin
journal, July 1997


Single spin detection by magnetic resonance force microscopy
journal, July 2004


An atomic force microscope tip designed to measure time-varying nanomechanical forces
journal, July 2007


Experimental determination of the rate law for charge carrier decay in a polythiophene: Fullerene solar cell
journal, March 2008


Inverting dynamic force microscopy: From signals to time-resolved interaction forces
journal, June 2002


Real-space imaging of transient carrier dynamics by nanoscale pump–probe microscopy
journal, October 2010


Ultrafast scanning probe microscopy
journal, November 1993


Nanoscale Morphology of High-Performance Polymer Solar Cells
journal, April 2005


Dielectric fluctuations in force microscopy: Noncontact friction and frequency jitter
journal, June 2008


Quantifying Electric Field Gradient Fluctuations over Polymers Using Ultrasensitive Cantilevers
journal, June 2009


    Works referencing / citing this record: