Sub-microsecond-resolution probe microscopy

Ginger, David; Giridharagopal, Rajiv; Moore, David; Rayermann, Glennis; Reid, Obadiah

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Title: Sub-microsecond-resolution probe microscopy

Abstract

Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.

Inventors:: Ginger, David; Giridharagopal, Rajiv; Moore, David; Rayermann, Glennis; Reid, Obadiah

Issue Date:: 2014-04-01

Research Org.:: University of Washington, Seattle, WA (United States). Center for Commercialization

Sponsoring Org.:: USDOE

OSTI Identifier:: 1128706

Patent Number(s):: 8686358

Application Number:: 13/232,859

Assignee:: University of Washington through its Center for Commercialization (Seattle, WA)

Patent Classifications (CPCs):: B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES

G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS

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B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
B82Y35/00 - Methods or apparatus for measurement or analysis of nanostructures

G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
G01Q60/30 - Scanning potential microscopy
G01Q60/32 - AC mode

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DOE Contract Number:: SC0001084

Resource Type:: Patent

Resource Relation:: Patent File Date: 2011 Sep 14

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION

Citation Formats


                    Ginger, David, Giridharagopal, Rajiv, Moore, David, Rayermann, Glennis, and Reid, Obadiah. Sub-microsecond-resolution probe microscopy.  United States: N. p., 2014. 
        Web.

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                    Ginger, David, Giridharagopal, Rajiv, Moore, David, Rayermann, Glennis, & Reid, Obadiah. Sub-microsecond-resolution probe microscopy.  United States.

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                    Ginger, David, Giridharagopal, Rajiv, Moore, David, Rayermann, Glennis, and Reid, Obadiah. Tue .  
        "Sub-microsecond-resolution probe microscopy".  United States.  https://www.osti.gov/servlets/purl/1128706.

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@article{osti_1128706,

  title        = {Sub-microsecond-resolution probe microscopy},

  author       = {Ginger, David and Giridharagopal, Rajiv and Moore, David and Rayermann, Glennis and Reid, Obadiah},

  abstractNote = {Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2014},

  month        = {4}

}

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Works referencing / citing this record:

Determination of local contact potential difference by noncontact atomic force microscopy
patent, October 2017

Gross, Leo; Meyer, Gerhard; Schuler, Bruno
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Similar Records

Title: Sub-microsecond-resolution probe microscopy

Abstract

Citation Formats

Non-contact measurement of electrical waveforms on the surface of a sample using time domain gating patent, September 1999

Multi-pulse sampling of signals using electrostatic force sampling patent, October 2000

Methods and apparatuses using proximal probes patent, December 2008

Probe apparatus for measuring an electron state on a sample surface patent, February 2009

Probe apparatus for measuring an electron state on a sample surface patent, January 2011

Atomic force microscopy devices, arrangements and systems patent, December 2011

Method for determining tribological properties of a sample surface using a scanning microscope (sem) and associated scanning microscope patent-application, July 2006

Probe Apparatus patent-application, May 2007

Atomic Force Microscope Using A Torsional Harmonic Cantilever patent-application, February 2008

Probe Apparatus for Measuring an Electron State on a Sample Surface patent-application, June 2009

Measurement and Mapping of Molecular Stretching and Rupture Forces patent-application, July 2010

Atomic Force Microscope Including Accelerometer patent-application, February 2011

Composition and Methods for Photocontrolled Hybridization and Dehybridization of a Nucleic Acid patent-application, June 2013

Spatially resolved femtosecond time correlation measurements on a GaAsP photodiode journal, April 1999

Time-resolved spectroscopy of single molecules using near-field and far-field optics journal, April 1996

Frequency modulation detection using high‐ Q cantilevers for enhanced force microscope sensitivity journal, January 1991

High-speed atomic force microscopy for nano-visualization of dynamic biomolecular processes journal, November 2008

Real Space Mapping of Li-Ion Transport in Amorphous Si Anodes with Nanometer Resolution journal, September 2010

Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions journal, February 1997

Estimating and interpreting the instantaneous frequency of a signal. I. Fundamentals journal, April 1992

Charge Photogeneration in Organic Solar Cells journal, November 2010

Time-resolved electrostatic force microscopy of polymer solar cells journal, August 2006

Mapping Local Photocurrents in Polymer/Fullerene Solar Cells with Photoconductive Atomic Force Microscopy journal, March 2007

Characterizing Morphology in Bulk Heterojunction Organic Photovoltaic Systems journal, March 2010

New SPM techniques for analyzing OPV materials journal, September 2010

Imaging of nanoscale charge transport in bulk heterojunction solar cells journal, June 2011

Ultrafast voltage-contrast scanning probe microscopy journal, December 1996

Noncontact estimation of intercellular breaking force using a femtosecond laser impulse quantified by atomic force microscopy journal, January 2011

Time-Resolved Electric Force Microscopy of Charge Trapping in Polycrystalline Pentacene journal, July 2007

Adaptive control of force microscope cantilever dynamics journal, September 2007

Radio-frequency scanning tunnelling microscopy journal, November 2007

Measurement of Fast Electron Spin Relaxation Times with Atomic Resolution journal, September 2010

Scanning Kelvin Probe Microscopy on Bulk Heterojunction Polymer Blends journal, May 2009

Real-Time Measurements of Conductance Switching and Motion of Single Oligo(phenylene ethynylene) Molecules journal, August 2007

Scanned-probe detection of electron spin resonance from a nitroxide spin probe journal, December 2009

Femtosecond pump-probe near-field optical microscopy journal, June 1999

Imaging the Evolution of Nanoscale Photocurrent Collection and Transport Networks during Annealing of Polythiophene/Fullerene Solar Cells journal, August 2009

Imaging Local Trap Formation in Conjugated Polymer Solar Cells: A Comparison of Time-Resolved Electrostatic Force Microscopy and Scanning Kelvin Probe Imaging journal, October 2010

Nanostructure determines the intensity-dependence of open-circuit voltage in plastic solar cells journal, October 2010

Microsecond atomic force sensing of protein conformational dynamics: Implications for the primary light-induced events in bacteriorhodopsin journal, July 1997

Single spin detection by magnetic resonance force microscopy journal, July 2004

An atomic force microscope tip designed to measure time-varying nanomechanical forces journal, July 2007

Experimental determination of the rate law for charge carrier decay in a polythiophene: Fullerene solar cell journal, March 2008

Inverting dynamic force microscopy: From signals to time-resolved interaction forces journal, June 2002

Real-space imaging of transient carrier dynamics by nanoscale pump–probe microscopy journal, October 2010

Ultrafast scanning probe microscopy journal, November 1993

Nanoscale Morphology of High-Performance Polymer Solar Cells journal, April 2005

Dielectric fluctuations in force microscopy: Noncontact friction and frequency jitter journal, June 2008

Quantifying Electric Field Gradient Fluctuations over Polymers Using Ultrasensitive Cantilevers journal, June 2009

Determination of local contact potential difference by noncontact atomic force microscopy patent, October 2017

Non-contact measurement of electrical waveforms on the surface of a sample using time domain gating
patent, September 1999

Multi-pulse sampling of signals using electrostatic force sampling
patent, October 2000

Methods and apparatuses using proximal probes
patent, December 2008

Probe apparatus for measuring an electron state on a sample surface
patent, February 2009

Probe apparatus for measuring an electron state on a sample surface
patent, January 2011

Atomic force microscopy devices, arrangements and systems
patent, December 2011

Method for determining tribological properties of a sample surface using a scanning microscope (sem) and associated scanning microscope
patent-application, July 2006

Probe Apparatus
patent-application, May 2007

Atomic Force Microscope Using A Torsional Harmonic Cantilever
patent-application, February 2008

Probe Apparatus for Measuring an Electron State on a Sample Surface
patent-application, June 2009

Measurement and Mapping of Molecular Stretching and Rupture Forces
patent-application, July 2010

Atomic Force Microscope Including Accelerometer
patent-application, February 2011

Composition and Methods for Photocontrolled Hybridization and Dehybridization of a Nucleic Acid
patent-application, June 2013

Spatially resolved femtosecond time correlation measurements on a GaAsP photodiode
journal, April 1999

Time-resolved spectroscopy of single molecules using near-field and far-field optics
journal, April 1996

Frequency modulation detection using high‐ Q cantilevers for enhanced force microscope sensitivity
journal, January 1991

High-speed atomic force microscopy for nano-visualization of dynamic biomolecular processes
journal, November 2008

Real Space Mapping of Li-Ion Transport in Amorphous Si Anodes with Nanometer Resolution
journal, September 2010

Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions
journal, February 1997

Estimating and interpreting the instantaneous frequency of a signal. I. Fundamentals
journal, April 1992

Charge Photogeneration in Organic Solar Cells
journal, November 2010

Time-resolved electrostatic force microscopy of polymer solar cells
journal, August 2006

Mapping Local Photocurrents in Polymer/Fullerene Solar Cells with Photoconductive Atomic Force Microscopy
journal, March 2007

Characterizing Morphology in Bulk Heterojunction Organic Photovoltaic Systems
journal, March 2010

New SPM techniques for analyzing OPV materials
journal, September 2010

Imaging of nanoscale charge transport in bulk heterojunction solar cells
journal, June 2011

Ultrafast voltage-contrast scanning probe microscopy
journal, December 1996

Noncontact estimation of intercellular breaking force using a femtosecond laser impulse quantified by atomic force microscopy
journal, January 2011

Time-Resolved Electric Force Microscopy of Charge Trapping in Polycrystalline Pentacene
journal, July 2007

Adaptive control of force microscope cantilever dynamics
journal, September 2007

Radio-frequency scanning tunnelling microscopy
journal, November 2007

Measurement of Fast Electron Spin Relaxation Times with Atomic Resolution
journal, September 2010

Scanning Kelvin Probe Microscopy on Bulk Heterojunction Polymer Blends
journal, May 2009

Real-Time Measurements of Conductance Switching and Motion of Single Oligo(phenylene ethynylene) Molecules
journal, August 2007

Scanned-probe detection of electron spin resonance from a nitroxide spin probe
journal, December 2009

Femtosecond pump-probe near-field optical microscopy
journal, June 1999

Imaging the Evolution of Nanoscale Photocurrent Collection and Transport Networks during Annealing of Polythiophene/Fullerene Solar Cells
journal, August 2009

Imaging Local Trap Formation in Conjugated Polymer Solar Cells: A Comparison of Time-Resolved Electrostatic Force Microscopy and Scanning Kelvin Probe Imaging
journal, October 2010

Nanostructure determines the intensity-dependence of open-circuit voltage in plastic solar cells
journal, October 2010

Microsecond atomic force sensing of protein conformational dynamics: Implications for the primary light-induced events in bacteriorhodopsin
journal, July 1997

Single spin detection by magnetic resonance force microscopy
journal, July 2004

An atomic force microscope tip designed to measure time-varying nanomechanical forces
journal, July 2007

Experimental determination of the rate law for charge carrier decay in a polythiophene: Fullerene solar cell
journal, March 2008

Inverting dynamic force microscopy: From signals to time-resolved interaction forces
journal, June 2002

Real-space imaging of transient carrier dynamics by nanoscale pump–probe microscopy
journal, October 2010

Ultrafast scanning probe microscopy
journal, November 1993

Nanoscale Morphology of High-Performance Polymer Solar Cells
journal, April 2005

Dielectric fluctuations in force microscopy: Noncontact friction and frequency jitter
journal, June 2008

Quantifying Electric Field Gradient Fluctuations over Polymers Using Ultrasensitive Cantilevers
journal, June 2009

Determination of local contact potential difference by noncontact atomic force microscopy
patent, October 2017