Optically stimulated differential impedance spectroscopy
Abstract
Methods and apparatuses for evaluating a material are described. Embodiments typically involve use of an impedance measurement sensor to measure the impedance of a sample of the material under at least two different states of illumination. The states of illumination may include (a) substantially no optical stimulation, (b) substantial optical stimulation, (c) optical stimulation at a first wavelength of light, (d) optical stimulation at a second wavelength of light, (e) a first level of light intensity, and (f) a second level of light intensity. Typically a difference in impedance between the impedance of the sample at the two states of illumination is measured to determine a characteristic of the material.
- Inventors:
- Issue Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1124648
- Patent Number(s):
- 8653830
- Application Number:
- 12/326,223
- Assignee:
- UT-Battelle, LLC (Oak Ridge, TN)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- AC05-00OR22725
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Maxey, Lonnie C, Parks, II, James E, Lewis, Sr., Samuel A, and Partridge, Jr., William P. Optically stimulated differential impedance spectroscopy. United States: N. p., 2014.
Web.
Maxey, Lonnie C, Parks, II, James E, Lewis, Sr., Samuel A, & Partridge, Jr., William P. Optically stimulated differential impedance spectroscopy. United States.
Maxey, Lonnie C, Parks, II, James E, Lewis, Sr., Samuel A, and Partridge, Jr., William P. Tue .
"Optically stimulated differential impedance spectroscopy". United States. https://www.osti.gov/servlets/purl/1124648.
@article{osti_1124648,
title = {Optically stimulated differential impedance spectroscopy},
author = {Maxey, Lonnie C and Parks, II, James E and Lewis, Sr., Samuel A and Partridge, Jr., William P},
abstractNote = {Methods and apparatuses for evaluating a material are described. Embodiments typically involve use of an impedance measurement sensor to measure the impedance of a sample of the material under at least two different states of illumination. The states of illumination may include (a) substantially no optical stimulation, (b) substantial optical stimulation, (c) optical stimulation at a first wavelength of light, (d) optical stimulation at a second wavelength of light, (e) a first level of light intensity, and (f) a second level of light intensity. Typically a difference in impedance between the impedance of the sample at the two states of illumination is measured to determine a characteristic of the material.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {2}
}
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