Silicon-based visible and near-infrared optoelectric devices
Abstract
In one aspect, the present invention provides a silicon photodetector having a surface layer that is doped with sulfur inclusions with an average concentration in a range of about 0.5 atom percent to about 1.5 atom percent. The surface layer forms a diode junction with an underlying portion of the substrate. A plurality of electrical contacts allow application of a reverse bias voltage to the junction in order to facilitate generation of an electrical signal, e.g., a photocurrent, in response to irradiation of the surface layer. The photodetector exhibits a responsivity great than about 1 A/W for incident wavelengths in a range of about 250 nm to about 1050 nm, and a responsivity greater than about 0.1 A/W for longer wavelenths, e.g., up to about 3.5 microns.
- Inventors:
- Issue Date:
- Research Org.:
- Harvard College, Cambridge, MA, USA
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1109472
- Patent Number(s):
- 8604580
- Application Number:
- 13/267,618
- Assignee:
- President and Fellows of Harvard College (Cambridge, MA)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10S - TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- DOE Contract Number:
- FC36-016011051
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Mazur, Eric, and Carey, James Edward. Silicon-based visible and near-infrared optoelectric devices. United States: N. p., 2013.
Web.
Mazur, Eric, & Carey, James Edward. Silicon-based visible and near-infrared optoelectric devices. United States.
Mazur, Eric, and Carey, James Edward. Tue .
"Silicon-based visible and near-infrared optoelectric devices". United States. https://www.osti.gov/servlets/purl/1109472.
@article{osti_1109472,
title = {Silicon-based visible and near-infrared optoelectric devices},
author = {Mazur, Eric and Carey, James Edward},
abstractNote = {In one aspect, the present invention provides a silicon photodetector having a surface layer that is doped with sulfur inclusions with an average concentration in a range of about 0.5 atom percent to about 1.5 atom percent. The surface layer forms a diode junction with an underlying portion of the substrate. A plurality of electrical contacts allow application of a reverse bias voltage to the junction in order to facilitate generation of an electrical signal, e.g., a photocurrent, in response to irradiation of the surface layer. The photodetector exhibits a responsivity great than about 1 A/W for incident wavelengths in a range of about 250 nm to about 1050 nm, and a responsivity greater than about 0.1 A/W for longer wavelenths, e.g., up to about 3.5 microns.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2013},
month = {12}
}
Works referenced in this record:
Near-unity below-band-gap absorption by microstructured silicon
journal, March 2001
- Wu, C.; Crouch, C. H.; Zhao, L.
- Applied Physics Letters, Vol. 78, Issue 13, p. 1850-1852
Temperature dependence of photoluminescence in noncrystalline silicon
conference, June 2004
- Serpenguzel, Ali; Bilici, Temel; Inanc, Ibrahim
- Integrated Optoelectronic Devices 2004: Proceedings Volume 5349, Physics and Simulation of Optoelectronic Devices XII, Vol. 5349
Femtosecond-Laser-Assisted Microstructuring of Silicon Surfaces
journal, January 2003
- Carey, James E.; Crouch, Catherine H.; Mazur, Eric
- Optics and Photonics News, Vol. 14, Issue 2
Whiskerlike structure growth on silicon exposed to ArF excimer laser irradiation
journal, July 1996
- Sánchez, F.; Morenza, J. L.; Aguiar, R.
- Applied Physics Letters, Vol. 69, Issue 5, p. 620-622
Infrared absorption by sulfur-doped silicon formed by femtosecond laser irradiation
journal, November 2004
- Crouch, C. H.; Carey, J. E.; Shen, M.
- Applied Physics A, Vol. 79, Issue 7
Surface microstructuring and long-range ordering of silicon nanoparticles
journal, May 2002
- Fowlkes, J. D.; Pedraza, A. J.; Blom, D. A.
- Applied Physics Letters, Vol. 80, Issue 20, p. 3799-3801
Zn(MgBe)Se ultraviolet photodetectors
journal, June 2001
- Vigué, F.; Faurie, J. -P.
- Journal of Electronic Materials, Vol. 30, Issue 6
Surface nanostructuring of silicon
journal, July 2003
- Pedraza, A. J.; Fowlkes, J. D.; Guan, Y. -F.
- Applied Physics A, Vol. 77, Issue 2
Field emission from silicon microstructures formed by femtosecond laser assisted etching
conference, January 2001
- Carey, J. E.; Zhao, L.; Wu, C.
- CLEO 2001. Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Technical Digest, Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Technical Digest (IEEE Cat. No.01CH37170)
Formation of conical microstructures upon laser evaporation of solids
journal, August 2001
- Dolgaev, S. I.; Lavrishev, S. V.; Lyalin, A. A.
- Applied Physics A Materials Science & Processing, Vol. 73, Issue 2
Microstructuring of silicon with femtosecond laser pulses
journal, September 1998
- Her, Tsing-Hua; Finlay, Richard J.; Wu, Claudia
- Applied Physics Letters, Vol. 73, Issue 12, p. 1673-1675
Infrared absorption by conical silicon microstructures made in a variety of background gases using femtosecond-laser pulses
journal, March 2003
- Younkin, R.; Carey, J. E.; Mazur, E.
- Journal of Applied Physics, Vol. 93, Issue 5, p. 2626-2629
Femtosecond laser-assisted microstructuring of silicon for novel detector, sensing and display technologies
conference, January 2003
- Carey, J. E.; Mazur, E.
- 2003 IEEE LEOS Annual Meeting Conference Proceedings, The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003.
Novel conical microstructures created in silicon with femtosecond laser pulses
conference, January 1998
- Tsing-Hua Her, ; Finlay, R. J.; Wu, C.
- Technical Digest Summaries of papers presented at the Conference on Lasers and Electro-Optics Conference Edition. 1998 Technical Digest Series, Vol.6, Technical Digest. Summaries of Papers Presented at the Conference on Lasers and Electro-Optics. Conference Edition. 1998 Technical Digest Series, Vol.6 (IEEE Cat. No.98CH36178)
Modeling of the spectral response of PIN photodetectors Impact of exposed zone thickness, surface recombination velocity and trap concentration
journal, February 2004
- Bouhdada, A.; Marrakh, R.; Vigué, F.
- Microelectronics Reliability, Vol. 44, Issue 2, p. 223-228
Comparison of structure and properties of femtosecond and nanosecond laser-structured silicon
journal, March 2004
- Crouch, C. H.; Carey, J. E.; Warrender, J. M.
- Applied Physics Letters, Vol. 84, Issue 11, p. 1850-1852
Femtosecond laser-induced formation of spikes on silicon
journal, April 2000
- Her, T. -H.; Finlay, R. J.; Wu, C.
- Applied Physics A: Materials Science & Processing, Vol. 70, Issue 4
Visible luminescence from silicon surfaces microstructured in air
journal, September 2002
- Wu, C.; Crouch, C. H.; Zhao, L.
- Applied Physics Letters, Vol. 81, Issue 11, p. 1999-2001
Dynamics of the hydrodynamical growth of columns on silicon exposed to ArF excimer-laser irradiation
journal, January 1998
- Sánchez, F.; Morenza, J. L.; Aguiar, R.
- Applied Physics A: Materials Science & Processing, Vol. 66, Issue 1
Silicon microcolumn arrays grown by nanosecond pulsed-excimer laser irradiation
journal, April 1999
- Pedraza, A. J.; Fowlkes, J. D.; Lowndes, D. H.
- Applied Physics Letters, Vol. 74, Issue 16, p. 2322-2324
Formation of regular arrays of silicon microspikes by femtosecond laser irradiation through a mask
journal, March 2003
- Shen, M. Y.; Crouch, C. H.; Carey, J. E.
- Applied Physics Letters, Vol. 82, Issue 11, p. 1715-1717