Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components
Abstract
A processor-implemented method for determining aging of a processing unit in a processor the method comprising: calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit; combining the effective aging profile with process variation data, actual workload data and operating conditions data for the processing unit; and determining aging through an aging sensor of the processing unit using the effective aging profile, the process variation data, the actual workload data, architectural characteristics and redundancy data, and the operating conditions data for the processing unit.
- Inventors:
- Issue Date:
- Research Org.:
- International Business Machines Corp., Armonk, NY (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1107341
- Patent Number(s):
- 8549363
- Application Number:
- 12/727,967
- Assignee:
- International Business Machines Corporation (Armonk, NY)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
G - PHYSICS G06 - COMPUTING G06F - ELECTRIC DIGITAL DATA PROCESSING
- DOE Contract Number:
- B554331
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 97 MATHEMATICS AND COMPUTING
Citation Formats
Cher, Chen-Yong, Coteus, Paul W, Gara, Alan, Kursun, Eren, Paulsen, David P, Schuelke, Brian A, Sheets, II, John E, and Tian, Shurong. Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components. United States: N. p., 2013.
Web.
Cher, Chen-Yong, Coteus, Paul W, Gara, Alan, Kursun, Eren, Paulsen, David P, Schuelke, Brian A, Sheets, II, John E, & Tian, Shurong. Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components. United States.
Cher, Chen-Yong, Coteus, Paul W, Gara, Alan, Kursun, Eren, Paulsen, David P, Schuelke, Brian A, Sheets, II, John E, and Tian, Shurong. Tue .
"Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components". United States. https://www.osti.gov/servlets/purl/1107341.
@article{osti_1107341,
title = {Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components},
author = {Cher, Chen-Yong and Coteus, Paul W and Gara, Alan and Kursun, Eren and Paulsen, David P and Schuelke, Brian A and Sheets, II, John E and Tian, Shurong},
abstractNote = {A processor-implemented method for determining aging of a processing unit in a processor the method comprising: calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit; combining the effective aging profile with process variation data, actual workload data and operating conditions data for the processing unit; and determining aging through an aging sensor of the processing unit using the effective aging profile, the process variation data, the actual workload data, architectural characteristics and redundancy data, and the operating conditions data for the processing unit.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2013},
month = {10}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.