skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components

Abstract

A processor-implemented method for determining aging of a processing unit in a processor the method comprising: calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit; combining the effective aging profile with process variation data, actual workload data and operating conditions data for the processing unit; and determining aging through an aging sensor of the processing unit using the effective aging profile, the process variation data, the actual workload data, architectural characteristics and redundancy data, and the operating conditions data for the processing unit.

Inventors:
; ; ; ; ; ; ;
Issue Date:
Research Org.:
International Business Machines Corporation (Armonk, NY)
Sponsoring Org.:
USDOE
OSTI Identifier:
1107341
Patent Number(s):
8,549,363
Application Number:
12/727,967
Assignee:
International Business Machines Corporation (Armonk, NY)
DOE Contract Number:  
B554331
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
97 MATHEMATICS AND COMPUTING

Citation Formats

Cher, Chen-Yong, Coteus, Paul W, Gara, Alan, Kursun, Eren, Paulsen, David P, Schuelke, Brian A, Sheets, II, John E, and Tian, Shurong. Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components. United States: N. p., 2013. Web.
Cher, Chen-Yong, Coteus, Paul W, Gara, Alan, Kursun, Eren, Paulsen, David P, Schuelke, Brian A, Sheets, II, John E, & Tian, Shurong. Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components. United States.
Cher, Chen-Yong, Coteus, Paul W, Gara, Alan, Kursun, Eren, Paulsen, David P, Schuelke, Brian A, Sheets, II, John E, and Tian, Shurong. Tue . "Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components". United States. https://www.osti.gov/servlets/purl/1107341.
@article{osti_1107341,
title = {Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components},
author = {Cher, Chen-Yong and Coteus, Paul W and Gara, Alan and Kursun, Eren and Paulsen, David P and Schuelke, Brian A and Sheets, II, John E and Tian, Shurong},
abstractNote = {A processor-implemented method for determining aging of a processing unit in a processor the method comprising: calculating an effective aging profile for the processing unit wherein the effective aging profile quantifies the effects of aging on the processing unit; combining the effective aging profile with process variation data, actual workload data and operating conditions data for the processing unit; and determining aging through an aging sensor of the processing unit using the effective aging profile, the process variation data, the actual workload data, architectural characteristics and redundancy data, and the operating conditions data for the processing unit.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2013},
month = {10}
}

Patent:

Save / Share: