Title: Systems and methods for laser assisted sample transfer to solution for chemical analysis

Abstract

Systems and methods are described for laser ablation of an analyte from a specimen and capturing of the analyte in a dispensed solvent to form a testing solution. A solvent dispensing and extraction system can form a liquid microjunction with the specimen. The solvent dispensing and extraction system can include a surface sampling probe. The laser beam can be directed through the surface sampling probe. The surface sampling probe can also serve as an atomic force microscopy probe. The surface sampling probe can form a seal with the specimen. The testing solution including the analyte can then be analyzed using an analytical instrument or undergo further processing.

Inventors:

Van Berkel, Gary J; Kertesz, Vilmos; Ovchinnikova, Olga S

Issue Date:

2013-08-27

Research Org.:

Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Org.:

USDOE

OSTI Identifier:

1093283

Patent Number(s):

8519330

Application Number:

13/152,836

Assignee:

UT-Battelle, LLC (Knoxville, TN); University of Tennessee Research Foundation (Knoxville, TN)

Patent Classifications (CPCs):

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS

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G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N1/04 - in the solid state, e.g. by cutting
G01N1/22 - in the gaseous state {
G01N1/38 - Diluting, dispersing or mixing samples
G01N2001/045 - {Laser ablation
G01N2001/383 - {collecting and diluting in a flow of liquid}

G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS

G01Q30/02 - Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

H01J49/0463 - {Desorption by laser or particle beam, followed by ionisation as a separate step
H01J49/165 - {Electrospray ionisation}

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DOE Contract Number:  

AC05-00OR22725

Resource Type:

Patent

Country of Publication:

United States

Language:

English

Subject:

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY