skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Method and apparatus for characterizing and enhancing the functional performance of machine tools

Abstract

Disclosed are various systems and methods for assessing and improving the capability of a machine tool. The disclosure applies to machine tools having at least one slide configured to move along a motion axis. Various patterns of dynamic excitation commands are employed to drive the one or more slides, typically involving repetitive short distance displacements. A quantification of a measurable merit of machine tool response to the one or more patterns of dynamic excitation commands is typically derived for the machine tool. Examples of measurable merits of machine tool performance include workpiece surface finish, and the ability to generate chips of the desired length.

Inventors:
; ; ; ; ; ; ;
Issue Date:
Research Org.:
Y-12 (Oak Ridge Y-12 Plant (Y-12), Oak Ridge, TN (United States))
Sponsoring Org.:
USDOE
OSTI Identifier:
1083270
Patent Number(s):
8,432,119
Application Number:
12/760,159
Assignee:
Babcock & Wilcox Technical Services Y-12, LLC (Oak Ridge, TN)
DOE Contract Number:  
AC05-00OR22800
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING

Citation Formats

Barkman, William E, Babelay, Jr., Edwin F, Smith, Kevin Scott, Assaid, Thomas S, McFarland, Justin T, Tursky, David A, Woody, Bethany, and Adams, David. Method and apparatus for characterizing and enhancing the functional performance of machine tools. United States: N. p., 2013. Web.
Barkman, William E, Babelay, Jr., Edwin F, Smith, Kevin Scott, Assaid, Thomas S, McFarland, Justin T, Tursky, David A, Woody, Bethany, & Adams, David. Method and apparatus for characterizing and enhancing the functional performance of machine tools. United States.
Barkman, William E, Babelay, Jr., Edwin F, Smith, Kevin Scott, Assaid, Thomas S, McFarland, Justin T, Tursky, David A, Woody, Bethany, and Adams, David. Tue . "Method and apparatus for characterizing and enhancing the functional performance of machine tools". United States. https://www.osti.gov/servlets/purl/1083270.
@article{osti_1083270,
title = {Method and apparatus for characterizing and enhancing the functional performance of machine tools},
author = {Barkman, William E and Babelay, Jr., Edwin F and Smith, Kevin Scott and Assaid, Thomas S and McFarland, Justin T and Tursky, David A and Woody, Bethany and Adams, David},
abstractNote = {Disclosed are various systems and methods for assessing and improving the capability of a machine tool. The disclosure applies to machine tools having at least one slide configured to move along a motion axis. Various patterns of dynamic excitation commands are employed to drive the one or more slides, typically involving repetitive short distance displacements. A quantification of a measurable merit of machine tool response to the one or more patterns of dynamic excitation commands is typically derived for the machine tool. Examples of measurable merits of machine tool performance include workpiece surface finish, and the ability to generate chips of the desired length.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2013},
month = {4}
}

Patent:

Save / Share:

Works referenced in this record:

Predictive modeling of surface roughness and tool wear in hard turning using regression and neural networks
journal, April 2005


Development and application of a system for evaluating the feed-drive errors on computer numerically controlled machine tools
journal, October 1996


A new calibration method for parallel kinematics machine tools using orientation constraint
journal, July 2009


Development of a measuring method for motion accuracy of NC machine tools using links and rotary encoders
journal, January 2009


Self-calibration of parallel manipulators using an orientation constraint
conference, May 2009

  • Ren, Xiao-Dong; Feng, Zu-Ren; Su, Cheng-Ping
  • 2009 4th IEEE Conference on Industrial Electronics and Applications (ICIEA)
  • DOI: 10.1109/ICIEA.2009.5138727