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Title: Method to determine thermal profiles of nanoscale circuitry

Abstract

A platform that can measure the thermal profiles of devices with nanoscale resolution has been developed. The system measures the local temperature by using an array of nanoscale thermometers. This process can be observed in real time using a high resolution imagining technique such as electron microscopy. The platform can operate at extremely high temperatures.

Inventors:
;
Issue Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1083268
Patent Number(s):
8433536
Application Number:
12/526,714
Assignee:
The Regents of the University of California (Oakland, CA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01K - MEASURING TEMPERATURE
B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
DOE Contract Number:  
AC02-05CH11231
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Zettl, Alexander K, and Begtrup, Gavi E. Method to determine thermal profiles of nanoscale circuitry. United States: N. p., 2013. Web.
Zettl, Alexander K, & Begtrup, Gavi E. Method to determine thermal profiles of nanoscale circuitry. United States.
Zettl, Alexander K, and Begtrup, Gavi E. Tue . "Method to determine thermal profiles of nanoscale circuitry". United States. https://www.osti.gov/servlets/purl/1083268.
@article{osti_1083268,
title = {Method to determine thermal profiles of nanoscale circuitry},
author = {Zettl, Alexander K and Begtrup, Gavi E},
abstractNote = {A platform that can measure the thermal profiles of devices with nanoscale resolution has been developed. The system measures the local temperature by using an array of nanoscale thermometers. This process can be observed in real time using a high resolution imagining technique such as electron microscopy. The platform can operate at extremely high temperatures.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2013},
month = {4}
}

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Works referenced in this record:

Size- and Temperature-Dependent Structural Transitions in Gold Nanoparticles
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Erratum: Probing Nanoscale Solids at Thermal Extremes [Phys. Rev. Lett. 99 , 155901 (2007)]
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Selective Functionalization of Silicon Micro/Nanowire Sensors via Localized Joule Heating
conference, January 2007


Quantum-dot optical temperature probes
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Probing Nanoscale Solids at Thermal Extremes
journal, October 2007