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Title: Apparatus and method to achieve high-resolution microscopy with non-diffracting or refracting radiation

Abstract

An imaging system employing a coded aperture mask having multiple pinholes is provided. The coded aperture mask is placed at a radiation source to pass the radiation through. The radiation impinges on, and passes through an object, which alters the radiation by absorption and/or scattering. Upon passing through the object, the radiation is detected at a detector plane to form an encoded image, which includes information on the absorption and/or scattering caused by the material and structural attributes of the object. The encoded image is decoded to provide a reconstructed image of the object. Because the coded aperture mask includes multiple pinholes, the radiation intensity is greater than a comparable system employing a single pinhole, thereby enabling a higher resolution. Further, the decoding of the encoded image can be performed to generate multiple images of the object at different distances from the detector plane. Methods and programs for operating the imaging system are also disclosed.

Inventors:
; ;
Issue Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1080441
Patent Number(s):
8304737
Application Number:
12/572,536
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Tobin, Jr., Kenneth W., Bingham, Philip R., and Hawari, Ayman I. Apparatus and method to achieve high-resolution microscopy with non-diffracting or refracting radiation. United States: N. p., 2012. Web.
Tobin, Jr., Kenneth W., Bingham, Philip R., & Hawari, Ayman I. Apparatus and method to achieve high-resolution microscopy with non-diffracting or refracting radiation. United States.
Tobin, Jr., Kenneth W., Bingham, Philip R., and Hawari, Ayman I. Tue . "Apparatus and method to achieve high-resolution microscopy with non-diffracting or refracting radiation". United States. https://www.osti.gov/servlets/purl/1080441.
@article{osti_1080441,
title = {Apparatus and method to achieve high-resolution microscopy with non-diffracting or refracting radiation},
author = {Tobin, Jr., Kenneth W. and Bingham, Philip R. and Hawari, Ayman I.},
abstractNote = {An imaging system employing a coded aperture mask having multiple pinholes is provided. The coded aperture mask is placed at a radiation source to pass the radiation through. The radiation impinges on, and passes through an object, which alters the radiation by absorption and/or scattering. Upon passing through the object, the radiation is detected at a detector plane to form an encoded image, which includes information on the absorption and/or scattering caused by the material and structural attributes of the object. The encoded image is decoded to provide a reconstructed image of the object. Because the coded aperture mask includes multiple pinholes, the radiation intensity is greater than a comparable system employing a single pinhole, thereby enabling a higher resolution. Further, the decoding of the encoded image can be performed to generate multiple images of the object at different distances from the detector plane. Methods and programs for operating the imaging system are also disclosed.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2012},
month = {11}
}

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Works referenced in this record:

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