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Title: Microchip and wedge ion funnels and planar ion beam analyzers using same

Abstract

Electrodynamic ion funnels confine, guide, or focus ions in gases using the Dehmelt potential of oscillatory electric field. New funnel designs operating at or close to atmospheric gas pressure are described. Effective ion focusing at such pressures is enabled by fields of extreme amplitude and frequency, allowed in microscopic gaps that have much higher electrical breakdown thresholds in any gas than the macroscopic gaps of present funnels. The new microscopic-gap funnels are useful for interfacing atmospheric-pressure ionization sources to mass spectrometry (MS) and ion mobility separation (IMS) stages including differential IMS or FAIMS, as well as IMS and MS stages in various configurations. In particular, "wedge" funnels comprising two planar surfaces positioned at an angle and wedge funnel traps derived therefrom can compress ion beams in one dimension, producing narrow belt-shaped beams and laterally elongated cuboid packets. This beam profile reduces the ion density and thus space-charge effects, mitigating the adverse impact thereof on the resolving power, measurement accuracy, and dynamic range of MS and IMS analyzers, while a greater overlap with coplanar light or particle beams can benefit spectroscopic methods.

Inventors:
; ;
Issue Date:
Research Org.:
Hanford Site (HNF), Richland, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1079219
Patent Number(s):
8299443
Application Number:
13/087,100
Assignee:
Battelle Memorial Institute (Richland, WA)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
AC06-76RL01830
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Shvartsburg, Alexandre A, Anderson, Gordon A, and Smith, Richard D. Microchip and wedge ion funnels and planar ion beam analyzers using same. United States: N. p., 2012. Web.
Shvartsburg, Alexandre A, Anderson, Gordon A, & Smith, Richard D. Microchip and wedge ion funnels and planar ion beam analyzers using same. United States.
Shvartsburg, Alexandre A, Anderson, Gordon A, and Smith, Richard D. Tue . "Microchip and wedge ion funnels and planar ion beam analyzers using same". United States. https://www.osti.gov/servlets/purl/1079219.
@article{osti_1079219,
title = {Microchip and wedge ion funnels and planar ion beam analyzers using same},
author = {Shvartsburg, Alexandre A and Anderson, Gordon A and Smith, Richard D},
abstractNote = {Electrodynamic ion funnels confine, guide, or focus ions in gases using the Dehmelt potential of oscillatory electric field. New funnel designs operating at or close to atmospheric gas pressure are described. Effective ion focusing at such pressures is enabled by fields of extreme amplitude and frequency, allowed in microscopic gaps that have much higher electrical breakdown thresholds in any gas than the macroscopic gaps of present funnels. The new microscopic-gap funnels are useful for interfacing atmospheric-pressure ionization sources to mass spectrometry (MS) and ion mobility separation (IMS) stages including differential IMS or FAIMS, as well as IMS and MS stages in various configurations. In particular, "wedge" funnels comprising two planar surfaces positioned at an angle and wedge funnel traps derived therefrom can compress ion beams in one dimension, producing narrow belt-shaped beams and laterally elongated cuboid packets. This beam profile reduces the ion density and thus space-charge effects, mitigating the adverse impact thereof on the resolving power, measurement accuracy, and dynamic range of MS and IMS analyzers, while a greater overlap with coplanar light or particle beams can benefit spectroscopic methods.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2012},
month = {10}
}

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Works referenced in this record:

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