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Title: Semiconductive materials and associated uses thereof

Abstract

High rate radiation detectors are disclosed herein. The detectors include a detector material disposed inside the container, the detector material containing cadmium, tellurium, and zinc, a first dopant containing at least one of aluminum, chlorine, and indium, and a second dopant containing a rare earth metal. The first dopant has a concentration of about 500 to about 20,000 atomic parts per billion, and the second dopant has a concentration of about 200 to about 20,000 atomic parts per billion.

Inventors:
 [1];  [2];  [3]
  1. Pullman, WA
  2. Colfax, WA
  3. Waltham, MA
Issue Date:
Research Org.:
Washington State University Research Foundation (Pullman, WA)
Sponsoring Org.:
USDOE
OSTI Identifier:
1033765
Patent Number(s):
8049178
Application Number:
12/202,026
Assignee:
Washington State University Research Foundation (Pullman, WA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
DOE Contract Number:  
FG07-06ID14724
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Lynn, Kelvin, Jones, Kelly, and Ciampi, Guido. Semiconductive materials and associated uses thereof. United States: N. p., 2011. Web.
Lynn, Kelvin, Jones, Kelly, & Ciampi, Guido. Semiconductive materials and associated uses thereof. United States.
Lynn, Kelvin, Jones, Kelly, and Ciampi, Guido. Tue . "Semiconductive materials and associated uses thereof". United States. https://www.osti.gov/servlets/purl/1033765.
@article{osti_1033765,
title = {Semiconductive materials and associated uses thereof},
author = {Lynn, Kelvin and Jones, Kelly and Ciampi, Guido},
abstractNote = {High rate radiation detectors are disclosed herein. The detectors include a detector material disposed inside the container, the detector material containing cadmium, tellurium, and zinc, a first dopant containing at least one of aluminum, chlorine, and indium, and a second dopant containing a rare earth metal. The first dopant has a concentration of about 500 to about 20,000 atomic parts per billion, and the second dopant has a concentration of about 200 to about 20,000 atomic parts per billion.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2011},
month = {11}
}

Works referenced in this record:

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Electronic properties of A centers in CdTe: A comparison with experiment
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Chapter 6 Growth Methods of CdTe Nuclear Detector Materials
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Self‐Activation and Self‐Coactivation in Zinc Sulfide Phosphors
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Possible Application of γ-Ray Spectrometers Based on CdZnTe Detectors
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Fine-scale spatial response of CdZnTe radiation detectors
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Role of native defects in wide-band-gap semiconductors
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Improved CdZnTe detectors grown by vertical Bridgman process
journal, January 1997


Extension of longwavelength IR photovoltaic detector operation to near room-temperatures
journal, December 1995


First-principles study of DX centers in CdTe, ZnTe, and Cd x Zn 1 x Te alloys
journal, October 1995


Basic problems of vertical Bridgman growth of CdTe
journal, January 1993


The effect of detector performance on high count rate PET imaging with a tomograph based on position-sensitive detectors
journal, February 1988