Carbon nanotube oscillator surface profiling device and method of use
Abstract
The proposed device is based on a carbon nanotube oscillator consisting of a finite length outer stationary nanotube and a finite length inner oscillating nanotube. Its main function is to measure changes in the characteristics of the motion of the carbon nanotube oscillating near a sample surface, and profile the roughness of this surface. The device operates in a non-contact mode, thus it can be virtually non-wear and non-fatigued system. It is an alternative to the existing atomic force microscope (AFM) tips used to scan surfaces to determine their roughness.
- Inventors:
-
- Tampa, FL
- Fuquay Varina, NC
- Issue Date:
- Research Org.:
- University of South Florida (Tampa, FL)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1033113
- Patent Number(s):
- 8060943
- Application Number:
- 12/548,070
- Assignee:
- University of South Florida (Tampa, FL); North Carolina Central University (Durham, NC)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
- DOE Contract Number:
- FG02-06ER46297
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Popescu, Adrian, Woods, Lilia M, and Bondarev, Igor V. Carbon nanotube oscillator surface profiling device and method of use. United States: N. p., 2011.
Web.
Popescu, Adrian, Woods, Lilia M, & Bondarev, Igor V. Carbon nanotube oscillator surface profiling device and method of use. United States.
Popescu, Adrian, Woods, Lilia M, and Bondarev, Igor V. Tue .
"Carbon nanotube oscillator surface profiling device and method of use". United States. https://www.osti.gov/servlets/purl/1033113.
@article{osti_1033113,
title = {Carbon nanotube oscillator surface profiling device and method of use},
author = {Popescu, Adrian and Woods, Lilia M and Bondarev, Igor V},
abstractNote = {The proposed device is based on a carbon nanotube oscillator consisting of a finite length outer stationary nanotube and a finite length inner oscillating nanotube. Its main function is to measure changes in the characteristics of the motion of the carbon nanotube oscillating near a sample surface, and profile the roughness of this surface. The device operates in a non-contact mode, thus it can be virtually non-wear and non-fatigued system. It is an alternative to the existing atomic force microscope (AFM) tips used to scan surfaces to determine their roughness.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2011},
month = {11}
}
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