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Title: Nano-soldering to single atomic layer

Abstract

A simple technique to solder submicron sized, ohmic contacts to nanostructures has been disclosed. The technique has several advantages over standard electron beam lithography methods, which are complex, costly, and can contaminate samples. To demonstrate the soldering technique graphene, a single atomic layer of carbon, has been contacted, and low- and high-field electronic transport properties have been measured.

Inventors:
 [1];  [2]
  1. Berkeley, CA
  2. Kensington, CA
Issue Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1029265
Patent Number(s):
8033445
Application Number:
12/270,643
Assignee:
The Regents of the University of California (Oakland, CA)
Patent Classifications (CPCs):
B - PERFORMING OPERATIONS B23 - MACHINE TOOLS B23K - SOLDERING OR UNSOLDERING
B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
DOE Contract Number:  
AC02-05CH11231
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Girit, Caglar O, and Zettl, Alexander K. Nano-soldering to single atomic layer. United States: N. p., 2011. Web.
Girit, Caglar O, & Zettl, Alexander K. Nano-soldering to single atomic layer. United States.
Girit, Caglar O, and Zettl, Alexander K. Tue . "Nano-soldering to single atomic layer". United States. https://www.osti.gov/servlets/purl/1029265.
@article{osti_1029265,
title = {Nano-soldering to single atomic layer},
author = {Girit, Caglar O and Zettl, Alexander K},
abstractNote = {A simple technique to solder submicron sized, ohmic contacts to nanostructures has been disclosed. The technique has several advantages over standard electron beam lithography methods, which are complex, costly, and can contaminate samples. To demonstrate the soldering technique graphene, a single atomic layer of carbon, has been contacted, and low- and high-field electronic transport properties have been measured.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2011},
month = {10}
}

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Works referenced in this record:

Lithography-free fabrication of graphene devices
journal, April 2007


Measurement of Scattering Rate and Minimum Conductivity in Graphene
journal, December 2007


Methods for fabricating Ohmic contacts to nanowires and nanotubes
journal, January 2006

  • Stern, E.; Cheng, G.; Klemic, J. F.
  • Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 24, Issue 1
  • https://doi.org/10.1116/1.2162575

Detection of individual gas molecules adsorbed on graphene
journal, July 2007


Soldering to a single atomic layer
journal, November 2007