skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Microscopy imaging system and method employing stimulated raman spectroscopy as a contrast mechanism

Abstract

A microscopy imaging system includes a first light source for providing a first train of pulses at a first center optical frequency .omega..sub.1, a second light source for providing a second train of pulses at a second center optical frequency .omega..sub.2, a modulator system, an optical detector, and a processor. The modulator system is for modulating a beam property of the second train of pulses at a modulation frequency f of at least 100 kHz. The optical detector is for detecting an integrated intensity of substantially all optical frequency components of the first train of pulses from the common focal volume by blocking the second train of pulses being modulated. The processor is for detecting, a modulation at the modulation frequency f, of the integrated intensity of the optical frequency components of the first train of pulses to provide a pixel of an image for the microscopy imaging system.

Inventors:
 [1];  [2];  [3]
  1. Lexington, MA
  2. Boston, MA
  3. Cambridge, MA
Issue Date:
Research Org.:
President & Fellows of Harvard College (Cambridge, MA)
Sponsoring Org.:
USDOE
OSTI Identifier:
1027112
Patent Number(s):
8027032
Application Number:
12/196,746
Assignee:
President & Fellows of Harvard College (Cambridge, MA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
DOE Contract Number:  
FG02-07ER15875
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Xie, Xiaoliang Sunney, Freudiger, Christian, and Min, Wei. Microscopy imaging system and method employing stimulated raman spectroscopy as a contrast mechanism. United States: N. p., 2011. Web.
Xie, Xiaoliang Sunney, Freudiger, Christian, & Min, Wei. Microscopy imaging system and method employing stimulated raman spectroscopy as a contrast mechanism. United States.
Xie, Xiaoliang Sunney, Freudiger, Christian, and Min, Wei. Tue . "Microscopy imaging system and method employing stimulated raman spectroscopy as a contrast mechanism". United States. https://www.osti.gov/servlets/purl/1027112.
@article{osti_1027112,
title = {Microscopy imaging system and method employing stimulated raman spectroscopy as a contrast mechanism},
author = {Xie, Xiaoliang Sunney and Freudiger, Christian and Min, Wei},
abstractNote = {A microscopy imaging system includes a first light source for providing a first train of pulses at a first center optical frequency .omega..sub.1, a second light source for providing a second train of pulses at a second center optical frequency .omega..sub.2, a modulator system, an optical detector, and a processor. The modulator system is for modulating a beam property of the second train of pulses at a modulation frequency f of at least 100 kHz. The optical detector is for detecting an integrated intensity of substantially all optical frequency components of the first train of pulses from the common focal volume by blocking the second train of pulses being modulated. The processor is for detecting, a modulation at the modulation frequency f, of the integrated intensity of the optical frequency components of the first train of pulses to provide a pixel of an image for the microscopy imaging system.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2011},
month = {9}
}

Patent:

Save / Share: