Screening of silicon wafers used in photovoltaics

Sopori, Bhushan L; Sheldon, Peter

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Title: Screening of silicon wafers used in photovoltaics

Abstract

A method for screening silicon-based wafers used in the photovoltaic industry is provided herewith.

Inventors:

Sopori, Bhushan L ^[1]; Sheldon, Peter ^[2]

Denver, CO
Lakewood, CO

Issue Date:: 2011-08-30

Research Org.:: Midwest Research Institute, Kansas City, MO (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1023933

Patent Number(s):: 8006566

Application Number:: 11/722,981

Assignee:: Alliance for Sustainable Energy, LLC (Golden, CO)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES

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G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/9503 - {Wafer edge inspection}
G01N21/9505 - {Wafer internal defects, e.g. microcracks}

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
H01L31/18 - Processes or apparatus peculiar to the manufacture or treatment of these devices or of parts thereof

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DOE Contract Number:: AC36-99GO10337

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: 14 SOLAR ENERGY

Citation Formats


                    Sopori, Bhushan L, and Sheldon, Peter. Screening of silicon wafers used in photovoltaics.  United States: N. p., 2011. 
        Web.

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                    Sopori, Bhushan L, & Sheldon, Peter. Screening of silicon wafers used in photovoltaics.  United States.

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                    Sopori, Bhushan L, and Sheldon, Peter. Tue .  
        "Screening of silicon wafers used in photovoltaics".  United States.  https://www.osti.gov/servlets/purl/1023933.

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@article{osti_1023933,

  title        = {Screening of silicon wafers used in photovoltaics},

  author       = {Sopori, Bhushan L and Sheldon, Peter},

  abstractNote = {A method for screening silicon-based wafers used in the photovoltaic industry is provided herewith.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2011},

  month        = {8}

}

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Works referenced in this record:

Non-destructive optical methods for assessing defects in production of Si or SiGe materials
journal, July 2004

Higgs, V.; Laurent, N.; Fellous, C.
The European Physical Journal Applied Physics, Vol. 27, Issue 1-3
https://doi.org/10.1051/epjap:2004075

Graphic script provides quick classification of GaAs wafers
journal, March 2000

Mier, Millard G.
III-Vs Review, Vol. 13, Issue 2, p. 47-50
https://doi.org/10.1016/S0961-1290(00)88501-4

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Title: Screening of silicon wafers used in photovoltaics

Abstract

Citation Formats

Non-destructive optical methods for assessing defects in production of Si or SiGe materials journal, July 2004

Graphic script provides quick classification of GaAs wafers journal, March 2000

Non-destructive optical methods for assessing defects in production of Si or SiGe materials
journal, July 2004

Graphic script provides quick classification of GaAs wafers
journal, March 2000