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Title: System and methods to determine and monitor changes in microstructural properties

Abstract

A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. The present invention includes a database of data, wherein a first set of data is used for comparison with a second set of data to determine the conditions of the material microstructure.

Inventors:
 [1]
  1. Lincoln, NE
Issue Date:
Research Org.:
Universtiy of Nebraska (Lincoln, NE)
Sponsoring Org.:
USDOE
OSTI Identifier:
1018317
Patent Number(s):
7942058
Application Number:
12/079,925
Assignee:
Board of Regents of the Universtiy of Nebraska (Lincoln, NE)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G - PHYSICS G01 - MEASURING G01L - MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
DOE Contract Number:  
FG02-01ER45890
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Turner, Joseph Alan. System and methods to determine and monitor changes in microstructural properties. United States: N. p., 2011. Web.
Turner, Joseph Alan. System and methods to determine and monitor changes in microstructural properties. United States.
Turner, Joseph Alan. Tue . "System and methods to determine and monitor changes in microstructural properties". United States. https://www.osti.gov/servlets/purl/1018317.
@article{osti_1018317,
title = {System and methods to determine and monitor changes in microstructural properties},
author = {Turner, Joseph Alan},
abstractNote = {A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. The present invention includes a database of data, wherein a first set of data is used for comparison with a second set of data to determine the conditions of the material microstructure.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2011},
month = {5}
}

Patent:

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