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Title: Scanning optical microscope with long working distance objective

Abstract

A scanning optical microscope, including: a light source to generate a beam of probe light; collimation optics to substantially collimate the probe beam; a probe-result beamsplitter; a long working-distance, infinity-corrected objective; scanning means to scan a beam spot of the focused probe beam on or within a sample; relay optics; and a detector. The collimation optics are disposed in the probe beam. The probe-result beamsplitter is arranged in the optical paths of the probe beam and the resultant light from the sample. The beamsplitter reflects the probe beam into the objective and transmits resultant light. The long working-distance, infinity-corrected objective is also arranged in the optical paths of the probe beam and the resultant light. It focuses the reflected probe beam onto the sample, and collects and substantially collimates the resultant light. The relay optics are arranged to relay the transmitted resultant light from the beamsplitter to the detector.

Inventors:
 [1]
  1. Newark, DE
Issue Date:
Research Org.:
University of Delaware (Newark, DE)
Sponsoring Org.:
USDOE
OSTI Identifier:
1016124
Patent Number(s):
7817275
Application Number:
12/044,370
Assignee:
University of Delaware (Newark, DE)
Patent Classifications (CPCs):
G - PHYSICS G02 - OPTICS G02B - OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
DOE Contract Number:  
FG02-06CH11383
Resource Type:
Patent
Country of Publication:
United States
Language:
English

Citation Formats

Cloutier, Sylvain G. Scanning optical microscope with long working distance objective. United States: N. p., 2010. Web.
Cloutier, Sylvain G. Scanning optical microscope with long working distance objective. United States.
Cloutier, Sylvain G. Tue . "Scanning optical microscope with long working distance objective". United States. https://www.osti.gov/servlets/purl/1016124.
@article{osti_1016124,
title = {Scanning optical microscope with long working distance objective},
author = {Cloutier, Sylvain G},
abstractNote = {A scanning optical microscope, including: a light source to generate a beam of probe light; collimation optics to substantially collimate the probe beam; a probe-result beamsplitter; a long working-distance, infinity-corrected objective; scanning means to scan a beam spot of the focused probe beam on or within a sample; relay optics; and a detector. The collimation optics are disposed in the probe beam. The probe-result beamsplitter is arranged in the optical paths of the probe beam and the resultant light from the sample. The beamsplitter reflects the probe beam into the objective and transmits resultant light. The long working-distance, infinity-corrected objective is also arranged in the optical paths of the probe beam and the resultant light. It focuses the reflected probe beam onto the sample, and collects and substantially collimates the resultant light. The relay optics are arranged to relay the transmitted resultant light from the beamsplitter to the detector.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2010},
month = {10}
}

Patent:

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